Journal of Applied Crystallography

Volume 27, Part 2 (April 1994)


Cover illustration Cover illustration: Simulation of a section synchrotron-radiation topographof diamond showing Pendellösung fringes. Courtesy of G. Kowalski, A. R. Lang, A. P. W. Makepeace and M. Moore.

research papers



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J. Appl. Cryst. (1994). 27, 133-139    [doi:10.1107/S0021889893008519]

Two open-flow cryostats for macromolecular crystallography

T. Teng, W. Schildkamp, P. Dolmer and K. Moffat



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J. Appl. Cryst. (1994). 27, 140-145    [doi:10.1107/S0021889893009094]

High-resolution electron-microscopic studies of the polymorphs in Ag[bold delta]Se films

T. Okabe and K. Ura



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J. Appl. Cryst. (1994). 27, 146-150    [doi:10.1107/S0021889893007903]

The role of nucleation site in determining the morphology of the product crystal in a structural phase transition

I. Agmon and M. Kaftory



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J. Appl. Cryst. (1994). 27, 151-154    [doi:10.1107/S0021889893007897]

High-temperature (323-1323 K) furnace design for a transmission powder diffractometer

N. E. Brown and W. Weigel



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J. Appl. Cryst. (1994). 27, 155-158    [doi:10.1107/S0021889893007964]

Measurement of the static disorder contribution to the temperature factor in cubic stabilized ZrO2

D. N. Argyriou



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J. Appl. Cryst. (1994). 27, 159-163    [doi:10.1107/S0021889893014141]

High-resolution diffraction at synchrotron sources: correction for counting losses

C. S. G. Cousins



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J. Appl. Cryst. (1994). 27, 164-176    [doi:10.1107/S0021889893007605]

New methods for alignment of instrumentation for residual-stress measurements by means of neutron diffraction

P. C. Brand and H. J. Prask



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J. Appl. Cryst. (1994). 27, 177-189    [doi:10.1107/S0021889893007782]

Particular solutions of the PDF-to-ODF inversion problem of texture analysis by large-scale mathematical programming

H. Schaeben and J. J. Fundenberger


short communications



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J. Appl. Cryst. (1994). 27, 190-192    [doi:10.1107/S0021889893008684]

The use of Image Plates for Laue diffraction with synchrotron radiation with olivine single-crystal studies as an example

H. Euler, R. Gilles and G. Will



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J. Appl. Cryst. (1994). 27, 192-195    [doi:10.1107/S0021889893009835]

Anomalous X-ray scattering at the sulfur edge of poly(3-octylthiophene)

J. Mårdalen, C. Riekel and H. Müller



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J. Appl. Cryst. (1994). 27, 195-197    [doi:10.1107/S0021889893011057]

Remarks on four-circle angle calculations for surface diffraction

F. H. Cano and M. Martínez-Ripoll


laboratory notes



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J. Appl. Cryst. (1994). 27, 198-199    [doi:10.1107/S0021889893006740]

An inexpensive technique for handling solvent-dependent crystals

S. R. Drake



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J. Appl. Cryst. (1994). 27, 199    [doi:10.1107/S0021889893009173]

Crystallization in a laboratory chamber furnace

B. Cabric, T. Pavlovic and B. Zizic


computer program abstracts



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J. Appl. Cryst. (1994). 27, 200    [doi:10.1107/S0021889893007885]

ABSPSI - stand-alone analytical absorption calculation using crystal-defined [psi] values for specification of ray directions

N. W. Alcock and P. J. Marks



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J. Appl. Cryst. (1994). 27, 200-201    [doi:10.1107/S0021889893009537]

SCATTER - a program for calculating atomic scattering-factor coefficients for electrons

T. A. Ceska



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J. Appl. Cryst. (1994). 27, 201-202    [doi:10.1107/S0021889893009574]

XRS-82 runs on PC386/486 computers

D. Mucha and W. Lasocha


meeting reports



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J. Appl. Cryst. (1994). 27, 202-204    [doi:10.1107/S002188989409970X]

Meeting Report

R. J. Cernik and G. J. Gainsford


crystallographers



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J. Appl. Cryst. (1994). 27, 204    [doi:10.1107/S0021889894099693]

Crystallographers


new commercial products



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J. Appl. Cryst. (1994). 27, 204    [doi:10.1107/S0021889894099681]

new Commercial Products


books received



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J. Appl. Cryst. (1994). 27, 204    [doi:10.1107/S002188989409967X]

Growth of crystals. Vol 19. edited by E. I. Givargizov and S. A. Grinberg


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