Journal of Applied Crystallography

Volume 27, Part 2 (April 1994)

Cover illustration: Simulation of a section synchrotron-radiation topographof diamond showing Pendellösung fringes. Courtesy of G. Kowalski, A. R. Lang, A. P. W. Makepeace and M. Moore.

research papers
short communications
laboratory notes
computer program abstracts
meeting reports
crystallographers
new commercial products
books received

research papers

J. Appl. Cryst. (1994). 27, 133-139 [doi:10.1107/S0021889893008519]

Two open-flow cryostats for macromolecular crystallography

T. Teng, W. Schildkamp, P. Dolmer and K. Moffat

J. Appl. Cryst. (1994). 27, 140-145 [doi:10.1107/S0021889893009094]

High-resolution electron-microscopic studies of the polymorphs in Ag_2±Se films

T. Okabe and K. Ura

J. Appl. Cryst. (1994). 27, 146-150 [doi:10.1107/S0021889893007903]

The role of nucleation site in determining the morphology of the product crystal in a structural phase transition

I. Agmon and M. Kaftory

J. Appl. Cryst. (1994). 27, 151-154 [doi:10.1107/S0021889893007897]

High-temperature (323-1323 K) furnace design for a transmission powder diffractometer

N. E. Brown and W. Weigel

J. Appl. Cryst. (1994). 27, 155-158 [doi:10.1107/S0021889893007964]

Measurement of the static disorder contribution to the temperature factor in cubic stabilized ZrO₂

D. N. Argyriou

J. Appl. Cryst. (1994). 27, 159-163 [doi:10.1107/S0021889893014141]

High-resolution diffraction at synchrotron sources: correction for counting losses

C. S. G. Cousins

J. Appl. Cryst. (1994). 27, 164-176 [doi:10.1107/S0021889893007605]

New methods for alignment of instrumentation for residual-stress measurements by means of neutron diffraction

P. C. Brand and H. J. Prask

J. Appl. Cryst. (1994). 27, 177-189 [doi:10.1107/S0021889893007782]

Particular solutions of the PDF-to-ODF inversion problem of texture analysis by large-scale mathematical programming

H. Schaeben and J. J. Fundenberger

short communications

J. Appl. Cryst. (1994). 27, 190-192 [doi:10.1107/S0021889893008684]

The use of Image Plates for Laue diffraction with synchrotron radiation with olivine single-crystal studies as an example

H. Euler, R. Gilles and G. Will

J. Appl. Cryst. (1994). 27, 192-195 [doi:10.1107/S0021889893009835]

Anomalous X-ray scattering at the sulfur edge of poly(3-octylthiophene)

J. Mårdalen, C. Riekel and H. Müller

J. Appl. Cryst. (1994). 27, 195-197 [doi:10.1107/S0021889893011057]

Remarks on four-circle angle calculations for surface diffraction

F. H. Cano and M. Martínez-Ripoll

laboratory notes

J. Appl. Cryst. (1994). 27, 198-199 [doi:10.1107/S0021889893006740]

An inexpensive technique for handling solvent-dependent crystals

S. R. Drake

J. Appl. Cryst. (1994). 27, 199 [doi:10.1107/S0021889893009173]

Crystallization in a laboratory chamber furnace

B. Cabric, T. Pavlovic and B. Zizic

computer program abstracts

J. Appl. Cryst. (1994). 27, 200 [doi:10.1107/S0021889893007885]

ABSPSI - stand-alone analytical absorption calculation using crystal-defined values for specification of ray directions

N. W. Alcock and P. J. Marks

J. Appl. Cryst. (1994). 27, 200-201 [doi:10.1107/S0021889893009537]

SCATTER - a program for calculating atomic scattering-factor coefficients for electrons

T. A. Ceska

J. Appl. Cryst. (1994). 27, 201-202 [doi:10.1107/S0021889893009574]

XRS-82 runs on PC386/486 computers

D. Mucha and W. Lasocha

meeting reports

J. Appl. Cryst. (1994). 27, 202-204 [doi:10.1107/S002188989409970X]

Meeting Report

R. J. Cernik and G. J. Gainsford

crystallographers

J. Appl. Cryst. (1994). 27, 204 [doi:10.1107/S0021889894099693]

Crystallographers

new commercial products

J. Appl. Cryst. (1994). 27, 204 [doi:10.1107/S0021889894099681]

new Commercial Products

books received

J. Appl. Cryst. (1994). 27, 204 [doi:10.1107/S002188989409967X]