Journal of Applied Crystallography
Volume 27, Part 3 (June 1994)
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Cover illustration: Simulation of a section synchrotron-radiation topographof diamond showing Pendellösung fringes. Courtesy of G.
Kowalski, A. R. Lang, A. P. W. Makepeace and M. Moore. |
J. Appl. Cryst. (1994). 27, 205-231 [doi:10.1107/S0021889893011392]
Interpretation of diffuse X-ray scattering via models of disorder
T. R. Welberry and B. D. Butler
J. Appl. Cryst. (1994). 27, 232-240 [doi:10.1107/S0021889893007976]
Energy-dispersive phase plate for magnetic circular dichroism experiments in the X-ray range
C. Giles, C. Malgrange, J. Goulon, F. de Bergevin, C. Vettier, E. Dartyge, A. Fontaine, C. Giorgetti and S. Pizzini
J. Appl. Cryst. (1994). 27, 241-248 [doi:10.1107/S0021889893008337]
Propagating errors in small-angle scattering data treatment
D. I. Svergun and J. S. Pedersen
J. Appl. Cryst. (1994). 27, 249-256 [doi:10.1107/S0021889893008386]
Coated silicas and small-angle X-ray intensity behaviour
A. Benedetti and S. Ciccariello
J. Appl. Cryst. (1994). 27, 257-270 [doi:10.1107/S0021889893008398]
A study of high-resolution X-ray scattering data evaluation by the maximum-entropy method
J. J. Müller and S. Hansen
J. Appl. Cryst. (1994). 27, 271-277 [doi:10.1107/S0021889893008568]
The structure of pumice by neutron diffraction
M. A. Floriano, A. M. Venezia, G. Deganello, E. C. Svensson and J. H. Root
J. Appl. Cryst. (1994). 27, 278-282 [doi:10.1107/S0021889893008611]
X-ray texture analysis of thin films by the reflection method: intermediate regime in defocusing corrections
D. Chateigner, P. Germi and M. Pernet
J. Appl. Cryst. (1994). 27, 283-287 [doi:10.1107/S002188989300874X]
The study of defects and growth in organic crystals of thallium hydrogen phthalate (TAP)
Q. L. Zhao
J. Appl. Cryst. (1994). 27, 288-297 [doi:10.1107/S002188989300891X]
The use of the serial-correlations concept in the figure-of-merit function for powder diffraction profile fitting
Yu. G. Andreev
J. Appl. Cryst. (1994). 27, 298-301 [doi:10.1107/S0021889893009197]
Geometrical optimization of neutron small-angle scattering instruments
R. P. May
J. Appl. Cryst. (1994). 27, 302-315 [doi:10.1107/S0021889893009823]
Geometrical aspects of real-time powder diffraction using a normal generator and a linear diode-array detector
K. van Malssen, R. Peschar and H. Schenk
J. Appl. Cryst. (1994). 27, 316-325 [doi:10.1107/S0021889893009847]
The neutron transmission through a cylindrical guide tube
D. F. R. Mildner and H. Chen
J. Appl. Cryst. (1994). 27, 326-329 [doi:10.1107/S0021889893010386]
Investigation on helium bubbles in FeNiCr by small-angle neutron scattering: Guinier analysis using a size-dependent contrast factor
F. Carsughi
J. Appl. Cryst. (1994). 27, 330-337 [doi:10.1107/S002188989301043X]
Optimum intensity in small-angle neutron scattering. An experimental comparison between symmetric and asymmetric geometries
A. N. Falcão, J. S. Pedersen and K. Mortensen
J. Appl. Cryst. (1994). 27, 338-344 [doi:10.1107/S0021889893010441]
Mapping of two-dimensional lattice distortions in silicon crystals at submicrometer resolution from X-ray rocking-curve data
A. Yu. Nikulin, O. Sakata, H. Hashizume and P. V. Petrashen
J. Appl. Cryst. (1994). 27, 345-357 [doi:10.1107/S0021889893010568]
Applicabilities of the Warren-Averbach analysis and an alternative analysis for separation of size and strain broadening
J. G. M. van Berkum, A. C. Vermeulen, R. Delhez, T. H. de Keijser and E. J. Mittemeijer
J. Appl. Cryst. (1994). 27, 358-361 [doi:10.1107/S0021889893010714]
Evalution of volume fractions of fiber-type texture components
L. Zuo, J. Muller and C. Esling
J. Appl. Cryst. (1994). 27, 362-368 [doi:10.1107/S0021889893011045]
Phase transitions in the Pb5(Cr1-xAlx)F19 system
J. Ravez, V. Andriamampianina, A. Simon, L. Rabardel, J. Ihringer and S. C. Abrahams
J. Appl. Cryst. (1994). 27, 369-378 [doi:10.1107/S0021889893011069]
Apparatus function of a five-crystal X-ray diffractometer with a four-reflection monochromator
M. O. Möller
J. Appl. Cryst. (1994). 27, 379-384 [doi:10.1107/S0021889893011227]
Simulation of electron diffraction patterns of alloys with oriented precipitates
T. Akbay, K. Aydinol and A. S. Bor
J. Appl. Cryst. (1994). 27, 385-392 [doi:10.1107/S0021889893008593]
Collection and analysis of powder diffraction data with near-constant counting statistics
I. C. Madsen and R. J. Hill
J. Appl. Cryst. (1994). 27, 393-398 [doi:10.1107/S0021889893013585]
Diffuse neutron scattering from an in situ grown ![[alpha]](/logos/entities/alpha_rmgif.gif)
-AgI single crystal
D. A. Keen, V. M. Nield and R. L. McGreevy
J. Appl. Cryst. (1994). 27, 399-405 [doi:10.1107/S0021889893006211]
Ab initio structure determination of Zr(OH)2SO4.3H2O
using the conventional monochromatic X-ray powder diffraction
D. Gascoigne, S. E. Tarling, P. Barnes, C. F. Pygall, P. Bénard and D. Louër
J. Appl. Cryst. (1994). 27, 406-410 [doi:10.1107/S0021889893011379]
X-ray Berg-Barrett topography of the deformation substructure of stabilized zirconium oxide single crystals deformed at 1673 K
F. Guiberteau, F. L. Cumbrera, A. Dominguez-Rodriguez, E. Fries and J. Castaing
J. Appl. Cryst. (1994). 27, 411-417 [doi:10.1107/S0021889893011380]
Ab initio solution of misfit layer structures by automatic Patterson and direct methods
P. T. Beurskens, G. Beurskens, E. J. W. Lam, S. van Smaalen and H. Fan
J. Appl. Cryst. (1994). 27, 418-419 [doi:10.1107/S0021889893009185]
Neutron diffraction investigations of thermal atomic displacements in Ta and Ag
J. Bashir, M. Nasir Khan, Q. H. Khan, N. M. Butt, Z. Baisheng, Y. Jilian, J. Lan and Y. Chuntang
J. Appl. Cryst. (1994). 27, 419-421 [doi:10.1107/S002188989301369X]
Background correction of the SAXS intensities scattered by aged metallic glass
C. Meng
J. Appl. Cryst. (1994). 27, 421-426 [doi:10.1107/S0021889893009926]
ASIR: an automatic procedure for determining solvent structure in protein crystallography
H. Tong, J. Berghuis, J. Chen, Y. Luo, J. M. Guss, H. C. Freeman and G. D. Brayer
J. Appl. Cryst. (1994). 27, 426-429 [doi:10.1107/S0021889893011112]
P-RISCON: a real-space scavenger for crystal structure determination from powder diffraction data
N. Masciocchi, R. Bianchi, P. Cairati, G. Mezza, T. Pilati and A. Sironi
J. Appl. Cryst. (1994). 27, 430-432 [doi:10.1107/S0021889893012968]
EDIM93: a program for electron diffraction intensity measurement from photographic data
T. Z. Cheng, J. F. Wang, Z. H. Wan and B. D. Sha
J. Appl. Cryst. (1994). 27, 432-434 [doi:10.1107/S0021889893012610]
XRDA: a program for energy-dispersive X-ray diffraction analysis on a PC
S. Desgreniers and K. Lagarec
J. Appl. Cryst. (1994). 27, 435 [doi:10.1107/S002188989400021X]
SIR92 - a program for automatic solution of crystal structures by direct methods
A. Altomare, G. Cascarano, C. Giacovazzo, A. Guagliardi, M. C. Burla, G. Polidori and M. Camalli
J. Appl. Cryst. (1994). 27, 435-436 [doi:10.1107/S0021889894000221]
SIRPOW.92 - a program for automatic solution of crystal structures by direct methods optimized for powder data
A. Altomare, G. Cascarano, C. Giacovazzo, A. Guagliardi, M. C. Burla, G. Polidori and M. Camalli
J. Appl. Cryst. (1994). 27, 436-437 [doi:10.1107/S0021889894000920]
SUPERIMPOSE - a program for the unambiguous structural superposition of spatially related molecules, including macromolecules
K. Diederichs
J. Appl. Cryst. (1994). 27, 437 [doi:10.1107/S0021889893013834]
ORTEP92 - an improved PC version
I. Vickovic
J. Appl. Cryst. (1994). 27, 437-438 [doi:10.1107/S002188989400066X]
PROSZKI - a system of programs for powder diffraction data analysis
W. Lasocha and K. Lewinski
J. Appl. Cryst. (1994). 27, 438-439 [doi:10.1107/S002188989400230X]
ORTEX2.1 - a 1677-atom version of ORTEP with automatic cell outline and cell packing for use on a PC
P. McArdle
J. Appl. Cryst. (1994). 27, 439 [doi:10.1107/S0021889894099668]
Crystallographers
J. Appl. Cryst. (1994). 27, 439-440 [doi:10.1107/S0021889894002682]
Notes and News
J. Appl. Cryst. (1994). 27, 440 [doi:10.1107/S0021889894099656]
New Commercial Products
J. Appl. Cryst. (1994). 27, 440-441 [doi:10.1107/S0021889894000439]
The Rietveld method. (IUCr Monograph on Crystallography, No. 5) edited by R. A. Young
J. Appl. Cryst. (1994). 27, 441-442 [doi:10.1107/S0021889893013809]
X-ray diffraction at elevated temperatures: a method for in situ processing analysis by D. D. L. Chung, P. W. DeHaven, H. Arnold and
D. Ghosh
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