Journal of Applied Crystallography

Volume 27, Part 4 (August 1994)

Cover illustration: Simulation of a section synchrotron-radiation topographof diamond showing Pendellösung fringes. Courtesy of G. Kowalski, A. R. Lang, A. P. W. Makepeace and M. Moore.

research papers
short communications
computer programs
laboratory notes
fast communications

research papers

J. Appl. Cryst. (1994). 27, 443-452 [doi:10.1107/S0021889893012713]

A macromolecular crystallization procedure employing diffusion cells of varying depths as reservoirs to tailor the time course of equilibration in hanging- and sitting-drop vapor-diffusion and microdialysis experiments

J. R. Luft, S. V. Arakali, M. J. Kirisits, J. Kalenik, I. Wawrzak, V. Cody, W. A. Pangborn and G. T. DeTitta

J. Appl. Cryst. (1994). 27, 453-462 [doi:10.1107/S0021889893008696]

Dynamical adjustment of crystal reflectivity by large-amplitude ultrasonic excitation for synchrotron X-ray monochromatization

I. V. Polikarpov, V. Panov and H. D. Bartunik

J. Appl. Cryst. (1994). 27, 463-474 [doi:10.1107/S0021889893008854]

Approximate intensity solutions for the multiple diffraction of neutrons in a many-beam case

C. B. R. Parente, V. L. Mazzocchi and F. J. F. Pimentel

J. Appl. Cryst. (1994). 27, 475-481 [doi:10.1107/S0021889893008866]

Study of -quartz by neutron multiple diffraction

V. L. Mazzocchi and C. B. R. Parente

J. Appl. Cryst. (1994). 27, 482-491 [doi:10.1107/S002188989301057X]

Extension of Kirste-Porod's law in the case of angulous interfaces

R. Sobry, F. Fontaine and J. Ledent

J. Appl. Cryst. (1994). 27, 492-496 [doi:10.1107/S0021889893012348]

R values in analysis of powder diffraction data using Rietveld refinement

E. Jansen, W. Schäfer and G. Will

J. Appl. Cryst. (1994). 27, 497-503 [doi:10.1107/S0021889893012439]

Identification of {2 $\overline{1}$ $\overline{1}$ 0} and {10 $\overline{1}$ 0} Laue patterns of hexagonal and rhombohedral silicon carbide polytypes

M. Yoganathan, W. Suttrop, R. P. Devaty and W. J. Choyke

J. Appl. Cryst. (1994). 27, 504-509 [doi:10.1107/S0021889893012592]

Volume-specific amino acid analysis: a method for Z_a determination

P. D. Kwong, A. Pound and W. A. Hendrickson

J. Appl. Cryst. (1994). 27, 510-516 [doi:10.1107/S0021889893013160]

Estimation of the mosaic spread and the mosaic-block size of zinc single-crystal spheres by simulations of scans with UMWEG90

E. Rossmanith, G. Adiwidjaja, J. Eck, G. Kumpat and G. Ulrich

J. Appl. Cryst. (1994). 27, 517-520 [doi:10.1107/S0021889893013172]

A note on preprocessing of diffraction pole-density data

D. Nikolayev and K. Ullemeyer

J. Appl. Cryst. (1994). 27, 521-526 [doi:10.1107/S0021889893013974]

Neutron focusing optics for low-resolution small-angle scattering

D. F. R. Mildner

J. Appl. Cryst. (1994). 27, 527-531 [doi:10.1107/S002188989301297X]

Thermal-expansion tensors of pentaerythritol (PE) and pentaglycerin (PG) and compositional deformation tensor of PG_1-xPE_x molecular alloys

M. Barrio, J. Font, D. O. López, J. Muntasell, J. L. Tamarit and Y. Haget

J. Appl. Cryst. (1994). 27, 532-542 [doi:10.1107/S0021889894000233]

Laue image analysis. III. The collection and analysis of deliberately streaked Laue exposures

A. K. Shrive and T. J. Greenhough

J. Appl. Cryst. (1994). 27, 543-550 [doi:10.1107/S002188989301235X]

Real-time X-ray synchrotron powder diffraction studies of the dehydration processes in scolecite and mesolite

K. Ståhl and J. Hanson

J. Appl. Cryst. (1994). 27, 551-557 [doi:10.1107/S0021889894000208]

X-ray triple-crystal diffractometry of defects in epitaxic layers

V. Holý, K. Wolf, M. Kastner, H. Stanzl and W. Gebhardt

J. Appl. Cryst. (1994). 27, 558-562 [doi:10.1107/S0021889894000403]

Small-angle X-ray scattering analysis of particle-size distributions of mesoscopic metallic systems with consideration of the particle form factor

H. G. Krauthäuser, W. Heitmann, A. Kops and G. Nimtz

J. Appl. Cryst. (1994). 27, 563-566 [doi:10.1107/S0021889894000427]

The structure and optical activity of SrS₂O₆^.4H₂O

E. de Matos Gomes, F. J. Zúñiga, J. Ortega and J. Etxebarria

J. Appl. Cryst. (1994). 27, 567-573 [doi:10.1107/S0021889894000750]

Disproportionation in mineral solid solutions: symmetry constraints on precipitate orientation and morphology. Implications for the study of oriented intergrowths

M. Boudeulle

J. Appl. Cryst. (1994). 27, 574-580 [doi:10.1107/S0021889894000932]

The maximum-entropy method without the positivity constraint - applications to the determination of the distance-distribution function in small-angle scattering

S. Steenstrup and S. Hansen

J. Appl. Cryst. (1994). 27, 581-584 [doi:10.1107/S0021889893008672]

Crystal structure and profile fitting of Mg(OD)₂ by time-of-flight neutron diffraction

D. E. Partin, M. O'Keefe and R. B. Von Dreele

J. Appl. Cryst. (1994). 27, 585-594 [doi:10.1107/S0021889893013597]

A new cell for in situ X-ray diffraction studies of catalysts and other materials under reactive gas atmospheres

D. C. Puxley, G. D. Squire and D. R. Bates

J. Appl. Cryst. (1994). 27, 595-608 [doi:10.1107/S0021889893013810]

Determination of size distribution from small-angle scattering data for systems with effective hard-sphere interactions

J. S. Pedersen

J. Appl. Cryst. (1994). 27, 609-612 [doi:10.1107/S0021889893014104]

A gas cell for collecting X-ray diffraction data from proteins

K. S. Kroeger and C. E. Kundrot

J. Appl. Cryst. (1994). 27, 613-621 [doi:10.1107/S0021889894000191]

SnB: crystal structure determination via shake-and-bake

R. Miller, S. M. Gallo, H. G. Khalak and C. M. Weeks

J. Appl. Cryst. (1994). 27, 622-626 [doi:10.1107/S0021889894000543]

TAOS: an automatic system for protein crystallization

N. Sadaoui, J. Janin and A. Lewit-Bentley

J. Appl. Cryst. (1994). 27, 627-636 [doi:10.1107/S002188989400227X]

Small-angle X-ray scattering in carbon fibers

A. Gupta, I. R. Harrison and J. Lahijani

J. Appl. Cryst. (1994). 27, 637-646 [doi:10.1107/S0021889894001846]

A novel X-ray precession goniometer for use with stationary single crystals in special enviroments. Adaptation of a closed-cycle refrigerator

R. Moret and D. Dallé

short communications

J. Appl. Cryst. (1994). 27, 647 [doi:10.1107/S0021889894006199]

Mapping of two-dimensional lattice distortions in silicon crystals at submicrometer resolution from X-ray rocking-curve data. Erratum

A. Yu. Nikulin, O. Sakata, H. Hashizume and P. V. Petrashen

J. Appl. Cryst. (1994). 27, 647-649 [doi:10.1107/S0021889894002475]

Determining the sign of optical rotation in linearly birefringent crystal sections

R. J. Lingard and A. R. Renshaw

computer programs

J. Appl. Cryst. (1994). 27, 649-653 [doi:10.1107/S0021889894001858]

MINIMAGE: a program for plotting electron-density maps

J. G. Arnez

J. Appl. Cryst. (1994). 27, 653-659 [doi:10.1107/S0021889894001500]

STATCW and STATCN: Fortran programs for conducting statistical tests for centrosymmetry

S. Parthasarathy, K. Sekar, M. N. Ponnuswamy, N. Elango and S. Karthikeyan

J. Appl. Cryst. (1994). 27, 660-661 [doi:10.1107/S0021889893014153]

A program to generate the Ramachandran plot using Microsoft Excel

Y. W. Chen

J. Appl. Cryst. (1994). 27, 661-665 [doi:10.1107/S0021889894000658]

Logistics of a program system. The DIRDIF program control and command protocol

J. M. M. Smits, C. Smykalla, P. T. Buerskens, W. P. Bosman and S. García-Granda

laboratory notes

J. Appl. Cryst. (1994). 27, 666-668 [doi:10.1107/S0021889893013822]

Hermetic sample housing for X-ray diffraction studies

W. J. Rink, H. G. Mathias and J. B. Schlenoff

J. Appl. Cryst. (1994). 27, 668-669 [doi:10.1107/S0021889893014244]

Direct observation of a crystal during X-ray data collection using a macroscope

C. H. L. Kennard

fast communications

J. Appl. Cryst. (1994). 27, 669-672 [doi:10.1107/S0021889894003869]