Journal of Applied Crystallography

Volume 27, Part 4 (August 1994)


Cover illustration Cover illustration: Simulation of a section synchrotron-radiation topographof diamond showing Pendellösung fringes. Courtesy of G. Kowalski, A. R. Lang, A. P. W. Makepeace and M. Moore.

research papers



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J. Appl. Cryst. (1994). 27, 443-452    [doi:10.1107/S0021889893012713]

A macromolecular crystallization procedure employing diffusion cells of varying depths as reservoirs to tailor the time course of equilibration in hanging- and sitting-drop vapor-diffusion and microdialysis experiments

J. R. Luft, S. V. Arakali, M. J. Kirisits, J. Kalenik, I. Wawrzak, V. Cody, W. A. Pangborn and G. T. DeTitta



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J. Appl. Cryst. (1994). 27, 453-462    [doi:10.1107/S0021889893008696]

Dynamical adjustment of crystal reflectivity by large-amplitude ultrasonic excitation for synchrotron X-ray monochromatization

I. V. Polikarpov, V. Panov and H. D. Bartunik



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J. Appl. Cryst. (1994). 27, 463-474    [doi:10.1107/S0021889893008854]

Approximate intensity solutions for the multiple diffraction of neutrons in a many-beam case

C. B. R. Parente, V. L. Mazzocchi and F. J. F. Pimentel



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J. Appl. Cryst. (1994). 27, 475-481    [doi:10.1107/S0021889893008866]

Study of [beta]-quartz by neutron multiple diffraction

V. L. Mazzocchi and C. B. R. Parente



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J. Appl. Cryst. (1994). 27, 482-491    [doi:10.1107/S002188989301057X]

Extension of Kirste-Porod's law in the case of angulous interfaces

R. Sobry, F. Fontaine and J. Ledent



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J. Appl. Cryst. (1994). 27, 492-496    [doi:10.1107/S0021889893012348]

R values in analysis of powder diffraction data using Rietveld refinement

E. Jansen, W. Schäfer and G. Will



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J. Appl. Cryst. (1994). 27, 497-503    [doi:10.1107/S0021889893012439]

Identification of {2\overline{1}\overline{1}0} and {10\overline{1}0} Laue patterns of hexagonal and rhombohedral silicon carbide polytypes

M. Yoganathan, W. Suttrop, R. P. Devaty and W. J. Choyke



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J. Appl. Cryst. (1994). 27, 504-509    [doi:10.1107/S0021889893012592]

Volume-specific amino acid analysis: a method for Za determination

P. D. Kwong, A. Pound and W. A. Hendrickson



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J. Appl. Cryst. (1994). 27, 510-516    [doi:10.1107/S0021889893013160]

Estimation of the mosaic spread and the mosaic-block size of zinc single-crystal spheres by simulations of [psi] scans with UMWEG90

E. Rossmanith, G. Adiwidjaja, J. Eck, G. Kumpat and G. Ulrich



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J. Appl. Cryst. (1994). 27, 517-520    [doi:10.1107/S0021889893013172]

A note on preprocessing of diffraction pole-density data

D. Nikolayev and K. Ullemeyer



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J. Appl. Cryst. (1994). 27, 521-526    [doi:10.1107/S0021889893013974]

Neutron focusing optics for low-resolution small-angle scattering

D. F. R. Mildner



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J. Appl. Cryst. (1994). 27, 527-531    [doi:10.1107/S002188989301297X]

Thermal-expansion tensors of pentaerythritol (PE) and pentaglycerin (PG) and compositional deformation tensor of PG1-xPEx molecular alloys

M. Barrio, J. Font, D. O. López, J. Muntasell, J. L. Tamarit and Y. Haget



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J. Appl. Cryst. (1994). 27, 532-542    [doi:10.1107/S0021889894000233]

Laue image analysis. III. The collection and analysis of deliberately streaked Laue exposures

A. K. Shrive and T. J. Greenhough



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J. Appl. Cryst. (1994). 27, 543-550    [doi:10.1107/S002188989301235X]

Real-time X-ray synchrotron powder diffraction studies of the dehydration processes in scolecite and mesolite

K. Ståhl and J. Hanson



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J. Appl. Cryst. (1994). 27, 551-557    [doi:10.1107/S0021889894000208]

X-ray triple-crystal diffractometry of defects in epitaxic layers

V. Holý, K. Wolf, M. Kastner, H. Stanzl and W. Gebhardt



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J. Appl. Cryst. (1994). 27, 558-562    [doi:10.1107/S0021889894000403]

Small-angle X-ray scattering analysis of particle-size distributions of mesoscopic metallic systems with consideration of the particle form factor

H. G. Krauthäuser, W. Heitmann, A. Kops and G. Nimtz



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J. Appl. Cryst. (1994). 27, 563-566    [doi:10.1107/S0021889894000427]

The structure and optical activity of SrS2O6.4H2O

E. de Matos Gomes, F. J. Zúñiga, J. Ortega and J. Etxebarria



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J. Appl. Cryst. (1994). 27, 567-573    [doi:10.1107/S0021889894000750]

Disproportionation in mineral solid solutions: symmetry constraints on precipitate orientation and morphology. Implications for the study of oriented intergrowths

M. Boudeulle



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J. Appl. Cryst. (1994). 27, 574-580    [doi:10.1107/S0021889894000932]

The maximum-entropy method without the positivity constraint - applications to the determination of the distance-distribution function in small-angle scattering

S. Steenstrup and S. Hansen



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J. Appl. Cryst. (1994). 27, 581-584    [doi:10.1107/S0021889893008672]

Crystal structure and profile fitting of Mg(OD)2 by time-of-flight neutron diffraction

D. E. Partin, M. O'Keefe and R. B. Von Dreele



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J. Appl. Cryst. (1994). 27, 585-594    [doi:10.1107/S0021889893013597]

A new cell for in situ X-ray diffraction studies of catalysts and other materials under reactive gas atmospheres

D. C. Puxley, G. D. Squire and D. R. Bates



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J. Appl. Cryst. (1994). 27, 595-608    [doi:10.1107/S0021889893013810]

Determination of size distribution from small-angle scattering data for systems with effective hard-sphere interactions

J. S. Pedersen



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J. Appl. Cryst. (1994). 27, 609-612    [doi:10.1107/S0021889893014104]

A gas cell for collecting X-ray diffraction data from proteins

K. S. Kroeger and C. E. Kundrot



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J. Appl. Cryst. (1994). 27, 613-621    [doi:10.1107/S0021889894000191]

SnB: crystal structure determination via shake-and-bake

R. Miller, S. M. Gallo, H. G. Khalak and C. M. Weeks



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J. Appl. Cryst. (1994). 27, 622-626    [doi:10.1107/S0021889894000543]

TAOS: an automatic system for protein crystallization

N. Sadaoui, J. Janin and A. Lewit-Bentley



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J. Appl. Cryst. (1994). 27, 627-636    [doi:10.1107/S002188989400227X]

Small-angle X-ray scattering in carbon fibers

A. Gupta, I. R. Harrison and J. Lahijani



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J. Appl. Cryst. (1994). 27, 637-646    [doi:10.1107/S0021889894001846]

A novel X-ray precession goniometer for use with stationary single crystals in special enviroments. Adaptation of a closed-cycle refrigerator

R. Moret and D. Dallé


short communications



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J. Appl. Cryst. (1994). 27, 647    [doi:10.1107/S0021889894006199]

Mapping of two-dimensional lattice distortions in silicon crystals at submicrometer resolution from X-ray rocking-curve data. Erratum

A. Yu. Nikulin, O. Sakata, H. Hashizume and P. V. Petrashen



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J. Appl. Cryst. (1994). 27, 647-649    [doi:10.1107/S0021889894002475]

Determining the sign of optical rotation in linearly birefringent crystal sections

R. J. Lingard and A. R. Renshaw


computer programs



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J. Appl. Cryst. (1994). 27, 649-653    [doi:10.1107/S0021889894001858]

MINIMAGE: a program for plotting electron-density maps

J. G. Arnez



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J. Appl. Cryst. (1994). 27, 653-659    [doi:10.1107/S0021889894001500]

STATCW and STATCN: Fortran programs for conducting statistical tests for centrosymmetry

S. Parthasarathy, K. Sekar, M. N. Ponnuswamy, N. Elango and S. Karthikeyan



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J. Appl. Cryst. (1994). 27, 660-661    [doi:10.1107/S0021889893014153]

A program to generate the Ramachandran plot using Microsoft Excel

Y. W. Chen



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J. Appl. Cryst. (1994). 27, 661-665    [doi:10.1107/S0021889894000658]

Logistics of a program system. The DIRDIF program control and command protocol

J. M. M. Smits, C. Smykalla, P. T. Buerskens, W. P. Bosman and S. García-Granda


laboratory notes



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J. Appl. Cryst. (1994). 27, 666-668    [doi:10.1107/S0021889893013822]

Hermetic sample housing for X-ray diffraction studies

W. J. Rink, H. G. Mathias and J. B. Schlenoff



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J. Appl. Cryst. (1994). 27, 668-669    [doi:10.1107/S0021889893014244]

Direct observation of a crystal during X-ray data collection using a macroscope

C. H. L. Kennard


fast communications



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J. Appl. Cryst. (1994). 27, 669-672    [doi:10.1107/S0021889894003869]

A generalized transformation to correct for image-plate and camera-geometry distortion in large-radius Weissenberg cameras

M. C. Lawrence


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