Journal of Applied Crystallography

Volume 27, Part 5 (October 1994)

Cover illustration: Simulation of a section synchrotron-radiation topographof diamond showing Pendellösung fringes. Courtesy of G. Kowalski, A. R. Lang, A. P. W. Makepeace and M. Moore.

• research papers
• short communications
• computer programs
• laboratory notes
• fast communications
• computer program abstracts
• crystallographers
• new commercial products

research papers

J. Appl. Cryst. (1994). 27, 673-681    [doi:10.1107/S0021889893014165]

Synthesizing and fitting linear position-sensitive detector step-scanned line profiles

R. W. Cheary and A. Coelho

J. Appl. Cryst. (1994). 27, 682-692    [doi:10.1107/S0021889894000245]

Aggregation in aluminium hydroxide solutions investigated by small-angle X-ray scattering

S. S. Kumru and H. D. Bale

J. Appl. Cryst. (1994). 27, 693-702    [doi:10.1107/S0021889894000373]

The effect of the shape function on small-angle scattering analysis by the maximum-entropy method

P. R. Jemian and A. J. Allen

J. Appl. Cryst. (1994). 27, 703-709    [doi:10.1107/S002188989400110X]

A new method of highly accurate orientation of single crystals on a standard powder diffractometer

E. Michalski

J. Appl. Cryst. (1994). 27, 710-715    [doi:10.1107/S0021889894001172]

Observations on growth of NaCl crystals out of the surface of sodalite [Na₈(Al₆Si₆O₂₄)Cl₂]

A. M. Hassib and H. Annersten

J. Appl. Cryst. (1994). 27, 716-722    [doi:10.1107/S002188989400186X]

Step size, scanning speed and shape of X-ray diffraction peak

H. Wang

J. Appl. Cryst. (1994). 27, 722-726    [doi:10.1107/S0021889894002116]

Refinement of hexamethylenetetramine based on diffractometer and imaging-plate data

J. Grochowski, P. Serda, K. S. Wilson and Z. Dauter

J. Appl. Cryst. (1994). 27, 727-732    [doi:10.1107/S0021889894002724]

Apparatus for the measurement of the electronic excited-state structure of single crystals using X-ray diffraction

M. A. White, M. R. Pressprich, P. Coppens and D. D. Coppens

J. Appl. Cryst. (1994). 27, 733-741    [doi:10.1107/S0021889894002311]

Diffuse X-ray scattering in potassium lithium sulfate, KLiSO₄

T. R. Welberry and A. M. Glazer

J. Appl. Cryst. (1994). 27, 742-754    [doi:10.1107/S0021889894002220]

Analysis of diffuse scattering from the mineral mullite

B. D. Butler and T. R. Welberry

J. Appl. Cryst. (1994). 27, 755-761    [doi:10.1107/S0021889894002062]

A simple method for determining orientation and misorientation of the cubic crystal specimen

Q. Liu

J. Appl. Cryst. (1994). 27, 762-766    [doi:10.1107/S0021889894002621]

A new method for determining the normals to planar structures and their trace directions in transmission electron microscopy

Q. Liu

J. Appl. Cryst. (1994). 27, 767-771    [doi:10.1107/S0021889894003249]

In-plane lattice-parameter and crystallite-size determination in a turbostratic graphite-like structure

Yu. G. Andreev and T. Lunström

J. Appl. Cryst. (1994). 27, 772-781    [doi:10.1107/S0021889894003389]

Computer simulation of local atomic displacements in alloys. Application to Guinier-Preston zones in Al-Cu

J. Kyobu, Y. Murata and M. Morinaga

J. Appl. Cryst. (1994). 27, 782-790    [doi:10.1107/S0021889894000762]

Scaling functions for the finite-size effect in fractal aggregates

Y. Zang and S. Meriani

J. Appl. Cryst. (1994). 27, 791-793    [doi:10.1107/S0021889894004681]

An optimal strategy for X-ray data collection on macromolecular crystals with position-sensitive detectors

I. Vickovic, K. H. Kalk, J. Drenth and B. W. Dijkstra

J. Appl. Cryst. (1994). 27, 794-801    [doi:10.1107/S0021889894001883]

Estimation of single-crystal elastic constants from textured polycrystal measurements

S. I. Wright

J. Appl. Cryst. (1994). 27, 802-844    [doi:10.1107/S0021889894000646]

International Union of Crystallography. Commission on Powder Diffraction. Rietveld refinement round robin. II. Analysis of monoclinic ZrO₂

R. J. Hill and L. M. D. Cranswick

short communications

J. Appl. Cryst. (1994). 27, 845-846    [doi:10.1107/S0021889894004589]

DIFFUSE: a procedure to measure diffuse intensity on a CAD-4 diffractometer with CAD-4-EXPRESS software

R. B. Neder

computer programs

J. Appl. Cryst. (1994). 27, 846-852    [doi:10.1107/S0021889894006746]

Development of the computational procedures for simulation and indexing of back-reflection Laue patterns

C. Marín, A. Cintas and E. Diéguez

laboratory notes

J. Appl. Cryst. (1994). 27, 853-854    [doi:10.1107/S0021889894004887]

A rapid method to assess X-ray area detectors by oriented protein crystal diffraction

J. C. Phillips

fast communications

J. Appl. Cryst. (1994). 27, 855-859    [doi:10.1107/S0021889894005881]

Geometrical limits and improvement of the diffraction optics in Gandolfi cameras

M. Gregorkiewitz

computer program abstracts

J. Appl. Cryst. (1994). 27, 860-861    [doi:10.1107/S0021889894006898]

PATGEN - an automatic program to generate theoretical Patterson peaks and to compare them with experimental Patterson peaks

B. Chevrier

J. Appl. Cryst. (1994). 27, 861-862    [doi:10.1107/S0021889894008009]

PAUTO - an automatic procedure for crystal structure solution by the Patterson method in the CAOS package

M. Camalli and R. Spagna

crystallographers

J. Appl. Cryst. (1994). 27, 862    [doi:10.1107/S0021889894099644]

Crystallographers

new commercial products

J. Appl. Cryst. (1994). 27, 862    [doi:10.1107/S0021889894099632]

New Commercial Products

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