Journal of Applied Crystallography
Volume 27, Part 6 (December 1994)
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Cover illustration: Simulation of a section synchrotron-radiation topographof diamond showing Pendellösung fringes. Courtesy of G.
Kowalski, A. R. Lang, A. P. W. Makepeace and M. Moore. |
J. Appl. Cryst. (1994). 27, 863-867 [doi:10.1107/S0021889894004036]
A correction of the Seemann-Bohlin method for stress measurements in thin films
L. Yu, H. Sun, K. Xu and J. He
J. Appl. Cryst. (1994). 27, 868-877 [doi:10.1107/S0021889894004048]
The point-spread function of X-ray image-intensifiers/CCD-camera and imaging-plate systems in crystallography: assessment and consequences for the dynamic range
D. Bourgeois, J. P. Moy, S. O. Svensson and Å. Kvick
J. Appl. Cryst. (1994). 27, 878-891 [doi:10.1107/S0021889894004097]
Analysis of small-angle scattering data dominated by multiple scattering for systems containing eccentrically shaped particles or pores
A. J. Allen and N. F. Berk
J. Appl. Cryst. (1994). 27, 892-900 [doi:10.1107/S0021889894004218]
A correction for powder diffraction peak asymmetry due to axial divergence
L. W. Finger, D. E. Cox and A. P. Jephcoat
J. Appl. Cryst. (1994). 27, 901-906 [doi:10.1107/S0021889894004693]
Simultaneous monitoring of amorphous and crystalline phases in silicalite precursor gels. An in situ hydrothermal and time-resolved small- and wide-angle X-ray
scattering study
W. H. Dokter, T. P. M. Beelen, H. F. van Garderen, R. A. van Santen, W. Bras, G. E. Derbyshire and G. R. Mant
J. Appl. Cryst. (1994). 27, 907-911 [doi:10.1107/S0021889894004899]
ASAXS from CdS1-x-doped silicate glasses
G. Goerigk, H.-G. Haubold, C. Klingshirn and A. Uhrig
J. Appl. Cryst. (1994). 27, 912-923 [doi:10.1107/S0021889894004954]
The statistical labeling method in in situ neutron scattering and diffraction measurements on ordered systems
S. Fujiwara and R. A. Mendelson
J. Appl. Cryst. (1994). 27, 924-933 [doi:10.1107/S0021889894005194]
Microtexture determination in Fe-Si alloy sheets by etch pitting. Comparison with the electron back-scattering pattern technique
T. Baudin, P. Paillard, F. Cruz and R. Penelle
J. Appl. Cryst. (1994). 27, 934-942 [doi:10.1107/S002188989400539X]
Using a two-dimensional detector for X-ray powder diffractometry
S. N. Sulyanov, A. N. Popov and D. M. Kheiker
J. Appl. Cryst. (1994). 27, 943-949 [doi:10.1107/S0021889894005406]
The characterization of a polycapillary neutron lens
D. F. R. Mildner and H. Chen
J. Appl. Cryst. (1994). 27, 950-960 [doi:10.1107/S0021889894005923]
On the preparation and X-ray data collection of isomorphous xenon derivatives
M. Schiltz, T. Prangé and R. Fourme
J. Appl. Cryst. (1994). 27, 961-966 [doi:10.1107/S0021889894006345]
Profiles in asymmetric diffraction with pseudo-parallel-beam geometry
H. Toraya and J. Yoshino
J. Appl. Cryst. (1994). 27, 967-970 [doi:10.1107/S0021889894006357]
An open-flow cryogenic cooler for single-crystal diffraction experiments
H. D. Bellamy, R. P. Phizackerley, S. M. Soltis and H. Hope
J. Appl. Cryst. (1994). 27, 971-979 [doi:10.1107/S002188989400676X]
Two-dimensional focusing X-ray optics: application of anisotropic elasticity theory for characterization of bent crystals
F. N. Chukhovskii, W. Z. Chang and E. Förster
J. Appl. Cryst. (1994). 27, 980-987 [doi:10.1107/S0021889894006758]
Improved X-ray and electron diffraction methods for twin determination in hexagonal crystals
N. Cheneau-Späth, R. Y. Fillit and J. H. Driver
J. Appl. Cryst. (1994). 27, 988-1001 [doi:10.1107/S0021889894006734]
X-ray topographic and optical imaging studies of synthetic diamonds
A. R. Lang
J. Appl. Cryst. (1994). 27, 1002-1005 [doi:10.1107/S002188989400720X]
A high-pressure study of thallium
J. S. Olsen, L. Gerward, S. Steenstrup and E. Johnson
J. Appl. Cryst. (1994). 27, 1006-1009 [doi:10.1107/S0021889894007764]
Reconstruction of symmetry-related molecules from protein data bank (PDB) files
R. W. W. Hooft, C. Sander and G. Vriend
J. Appl. Cryst. (1994). 27, 1010-1014 [doi:10.1107/S0021889894006242]
High-resolution time-of-flight measurements of the lattice parameter and thermal expansion of the icosahedral phase Al62Cu25.5Fe12.5
A. Quivy, S. Lefebvre, J. L. Soubeyroux, A. Filhol, R. Bellissent and R. M. Ibberson
J. Appl. Cryst. (1994). 27, 1015-1019 [doi:10.1107/S0021889894005911]
Slits and high-resolution X-ray diffraction
P. van der Sluis
J. Appl. Cryst. (1994). 27, 1020-1029 [doi:10.1107/S0021889894005704]
Small-angle neutron scattering study of dislocations in deformed single-crystal copper
B. J. Heuser
J. Appl. Cryst. (1994). 27, 1030-1038 [doi:10.1107/S0021889894007363]
The resolution function of a triple-crystal diffractometer for high-energy synchrotron radiation in nondispersive Laue geometry
H.-B. Neumann, U. Rutt, R. Bouchard, J. R. Schneider and H. Nagasawa
J. Appl. Cryst. (1994). 27, 1039-1040 [doi:10.1107/S0021889894006369]
An antiscatter device for low-temperature crystallographic experiments with imaging plates
A. Darovsky, R. Bolotovsky and P. Coppens
J. Appl. Cryst. (1994). 27, 1040-1042 [doi:10.1107/S0021889894008642]
Temperature dependence of the lattice constant in metallic sodium
H. Abe, K. Ohshima, T. Sukuki and Y. Watanabe
J. Appl. Cryst. (1994). 27, 1042-1045 [doi:10.1107/S0021889894008010]
Advances in X-ray diffraction based on two-dimensional diffraction theory. Derivation of the basic equation in orientation analysis
Q. Cong and F. Cong
J. Appl. Cryst. (1994). 27, 1045-1050 [doi:10.1107/S002188989400422X]
Early finding of preferred orientation: a new method
A. Altomare, G. Cascarano, C. Giacovazzo and A. Guagliardi
J. Appl. Cryst. (1994). 27, 1050-1051 [doi:10.1107/S0021889894004085]
ORBICAL - a program for calculation of orbital form factors of neutral atoms and ions
V. V. Chernyshev, S. G. Zhukov and H. Schenk
J. Appl. Cryst. (1994). 27, 1052-1055 [doi:10.1107/S002188989400470X]
Space-group recognition with the modified library program ACMM
K. Mika, J. Hauck and U. Funk-Kath
J. Appl. Cryst. (1994). 27, 1055-1060 [doi:10.1107/S0021889894004942]
FWR: a computer program for refining the molecular structure in the crystalline phase of polymers based on the analysis of the whole X-ray fiber diffraction
patterns
P. Iannelli
J. Appl. Cryst. (1994). 27, 1061-1063 [doi:10.1107/S0021889894004267]
A method of alignment of a four-circle diffractometer using a small collimator in the centre of the Eulerian cradle
S. Geremia, H. Burzlaff and W. Rothammel
J. Appl. Cryst. (1994). 27, 1063-1065 [doi:10.1107/S0021889894004322]
A novel monochromator housing with completely shielded beam path from X-ray source to sample
J. Ihringer and K. Röttger
J. Appl. Cryst. (1994). 27, 1065-1067 [doi:10.1107/S0021889894008101]
A quick adjustment method for crystal orientation in oscillation photography using the de Jong-Bouman camera
I.-H. Suh, J.-H. Lee, S.-S. Lim, B.-Y. Ryu and J.-R. Park
J. Appl. Cryst. (1994). 27, 1067 [doi:10.1107/S0021889894008940]
Modification of standard X-ray glass capillaries to improve data for small-angle scattering
S. J. Henderson
J. Appl. Cryst. (1994). 27, 1068 [doi:10.1107/S0021889894009052]
The use of ammonium succinate in protein crystallography
H. L. Monaco
J. Appl. Cryst. (1994). 27, 1068-1069 [doi:10.1107/S0021889894009611]
A high-temperature Guinier camera and its application to the decomposition of Co1-xS (jaipurite)
K. Bente, K. Hanke, K. Mariolacos, H. Bartels and E. Hensel
J. Appl. Cryst. (1994). 27, 1070-1074 [doi:10.1107/S0021889894008629]
Flash freezing of protein crystals: investigation of mosaic spread and diffraction limit with variation of cryoprotectant concentration
E. P. Mitchell and E. F. Garman
J. Appl. Cryst. (1994). 27, 1075 [doi:10.1107/S0021889894008654]
FOLDIT(LIGHT) - an interactive program for Macintosh computers to analyze and display Protein Data Bank coordinate files
J.-C. Jésior, A. Filhol and D. Tranqui
J. Appl. Cryst. (1994). 27, 1076-1077 [doi:10.1107/S0021889894099620]
Prices of IUCr Journals
J. Appl. Cryst. (1994). 27, 1079-1084
Subject index to volume 27 (1994)
J. Appl. Cryst. (1994). 27, 1085-1091
Author index to volume 27 (1994)
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