Journal of Applied Crystallography

Volume 28, Part 1 (February 1995)

Cover illustration: The observed X-ray diffuse scattering in the (h0l) section of 1,3-dibromo-2,5-diethyl-4,6-dimethylbenzene. Courtesy of T. R. Welberry and B. D. Butler.

international union of crystallography
research papers
short communications
computer programs
fast communications
computer program abstracts
crystallographers
international union of crystallography
notes and news
new commercial products
books received

international union of crystallography

J. Appl. Cryst. (1995). 28, 1-6 [doi:10.1107/S0021889895099699]

Notes for Authors

research papers

J. Appl. Cryst. (1995). 28, 7-13 [doi:10.1107/S002188989400467X]

Monitoring Phase Transitions using a Single Data Frame in Neutron Time-of-Flight Laue Diffraction

C. C. Wilson

Synopsis: The possibilities of applying neutron time-of-flight Laue diffraction in monitoring structural changes in single crystals are considered. Simulations show that useful structural information can be obtained from single data frames (single shots), leading to a substantial improvement in the time resolution for following such changes.

J. Appl. Cryst. (1995). 28, 14-19 [doi:10.1107/S0021889894006333]

Diffraction by Diffusely Scattering Materials of High Transparency

R. H. Bragg and J. B. Aladekomo

Synopsis: Simple methods are presented of correcting the wide-range X-ray diffraction patterns of diffusely scattering materials for distortion due to finite speciment length, high transparency, strong Compton scattering and contributions from small-angle scattering.

J. Appl. Cryst. (1995). 28, 20-25 [doi:10.1107/S0021889894007788]

A Multilayer-Coated Diffraction-Grating Device for Polarized and Unpolarized Neutron Interferometry

M. Mâaza and B. Pardo

Synopsis: The use of multilayer coatings in the classical Ioffe diffraction-grating neutron interferometer is proposed. This interferometer combines the properties of two periodic structures: dispersion by a diffraction grating and high reflectivity because of the multilayer coating.

J. Appl. Cryst. (1995). 28, 26-32 [doi:10.1107/S0021889894008320]

The Combination of Thermal Analysis and Time-Resolved X-ray Techniques: a Powerful Method for Materials Characterization

W. Bras, G. E. Derbyshire, A. Devine, S. M. Clark, J. Cooke, B. E. Komanschek and A. J. Ryan

Synopsis: A new differential thermal analyser has been developed suitable for combining with time-resolved X-ray equipment. The use of this instrument with simultaneous SAXS, SAXS/WAXS and energy-dispersive powder diffraction experiments is described.

J. Appl. Cryst. (1995). 28, 33-37 [doi:10.1107/S0021889894007776]

Time-Resolved X-ray Diffraction Study of the Staging Phase Transition in CuCl₂-Intercalated Graphite

K. F. van Malssen, P. Capková, H. Schenk and H. P. Boehm

Synopsis: A real-time X-ray diffraction study of staging phase transitions in CuCl₂-intercalated graphite during deintercalation in ambient air has been carried out. A position-sensitive detector was used to perform the real-time quantitative phase analysis at different stages of the deintercalation reaction.

J. Appl. Cryst. (1995). 28, 38-42 [doi:10.1107/S0021889894008319]

Akima Interpolation: a Tool used in Direct Slit-Length Desmearing Procedures of Non-Frequency-Limited X-ray Scattering Curves

J. J. Müller, E.-C. Müller, C. Gernat and R. Kröber

Synopsis: Direct slit-collimation correction of small-and wide-angle scattering data from semicrystalline materials on the basis of Akima polynomials and slit functions renders Soller-slit collimation unnecessary. A gain factor of four or five in scattered intensity results.

J. Appl. Cryst. (1995). 28, 43-48 [doi:10.1107/S0021889894008824]

Spatial-Distortion Corrections, for Laue Diffraction Patterns Recorded on Image Plates, Modelled using Polynomial Functions

J. W. Campbell, M. M. Harding and B. Kariuki

Synopsis: A polynomial-based spatial-distortion correction, derived from the diffraction pattern, has been used to enable good spot-position prediction for processing Laue diffraction data recorded on an image plate.

short communications

J. Appl. Cryst. (1995). 28, 49-52 [doi:10.1107/S0021889894009635]

Attenuation corrections for X-ray and neutron fibre diffraction studies

P. Langan, V. T. Forsyth and A. Mahendrasingam

Synopsis: The form of the transmission factor for sample geometries encountered in X-ray and neutron fibre diffraction studies is considered.

computer programs

J. Appl. Cryst. (1995). 28, 53-56 [doi:10.1107/S0021889894009428]

XABS2: an empirical absorption correction program

S. Parkin, B. Moezzi and H. Hope

Synopsis: The paper describes an algorithm for an empirical post-solution absorption correction. Only F_obs and structural parameters (isotropic level) are required.

fast communications

J. Appl. Cryst. (1995). 28, 57-60 [doi:10.1107/S0021889894010101]

High-resolution triple-crystal X-ray diffraction experiments performed at the Australian National Beamline Facility on a silicon sample with lateral periodic superstructure

A. Yu. Nikulin, A. W. Stevenson, H. Hashizume, S. W. Wilkins, D. Cookson, G. Foran and R. F. Garrett

Synopsis: An ion-implanted Si(111) sample with lateral periodic superstructure has been studied by high-resolution triple-crystal diffractometry at the Australian National Beamline Facility of the Photon Factory synchrotron. Detailed analysis of the data will yield a map, as a function of lateral position and depth, of the lattice distortions perpendicular to the sample surface.

J. Appl. Cryst. (1995). 28, 61-64 [doi:10.1107/S0021889894011118]

A possible new route to precise lattice-parameter measurement of perfect crystals using the divergent-X-ray beam method

A. R. Lang and G. Pang

Synopsis: Fine-scale dark streaks, only a few arc seconds in angular width, are discovered within the area of overlap at Kossel-line intersections. They delineate loci of coherent multiple diffraction and impose potentially useful markers on the broad-line divergent-beam pattern.

computer program abstracts

J. Appl. Cryst. (1995). 28, 65 [doi:10.1107/S0021889894010642]

SORTX - a program for on-screen stick-model editing and autosorting of SHELX files for use on a PC

P. McArdle

Synopsis: SORTX generates a stick model of the atoms or peaks in a SHELX file on a PC screen. Atoms are selected and renamed or deleted using the mouse.

J. Appl. Cryst. (1995). 28, 65-66 [doi:10.1107/S0021889894010630]

PARSET and PARSYM - production of files for neutron powder structure refinement program MORGUE and solution/refinement program PARAM

P. G. Byrom and B. W. Lucas

Synopsis: Interactive computer programs (PARSET and PARSYM) are described that create input files for programs MORGUE and PARAM, which perform neutron powder structure refinement solution with rigid-body positional and thermal-motion constraints.

crystallographers

J. Appl. Cryst. (1995). 28, 66 [doi:10.1107/S0021889894011830]

Crystallographers

international union of crystallography

J. Appl. Cryst. (1995). 28, 66-67 [doi:10.1107/S0021889894014226]

Nominations for the Ewald Prize

notes and news

J. Appl. Cryst. (1995). 28, 67 [doi:10.1107/S0021889895099687]

Notes and News

new commercial products

J. Appl. Cryst. (1995). 28, 67-68 [doi:10.1107/S0021889895099675]

New Commercial Products

books received

J. Appl. Cryst. (1995). 28, 68 [doi:10.1107/S0021889895099663]

Handbook of crystal growth. Vol. 1: Fundamentals. a: thermodynamics and kinetics; b: transport and stability edited by D. T. J. Hurle

J. Appl. Cryst. (1995). 28, 68 [doi:10.1107/S0021889895099651]

Accuracy in powder diffraction II edited by E. O. Prince and J. K. Stalick

J. Appl. Cryst. (1995). 28, 68 [doi:10.1107/S002188989509964X]

Out of the crystal maze. Chapters from the history of solid-state physics edited by L. Hoddeson, E. Braun, J. Teichmann and S. Weart

J. Appl. Cryst. (1995). 28, 68 [doi:10.1107/S0021889895099638]