Journal of Applied Crystallography

Volume 28, Part 1 (February 1995)


Cover illustration Cover illustration: The observed X-ray diffuse scattering in the (h0l) section of 1,3-dibromo-2,5-diethyl-4,6-dimethylbenzene. Courtesy of T. R. Welberry and B. D. Butler.

international union of crystallography



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J. Appl. Cryst. (1995). 28, 1-6    [doi:10.1107/S0021889895099699]

Notes for Authors


research papers



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J. Appl. Cryst. (1995). 28, 7-13    [doi:10.1107/S002188989400467X]

Monitoring Phase Transitions using a Single Data Frame in Neutron Time-of-Flight Laue Diffraction

C. C. Wilson

Synopsis: The possibilities of applying neutron time-of-flight Laue diffraction in monitoring structural changes in single crystals are considered. Simulations show that useful structural information can be obtained from single data frames (single shots), leading to a substantial improvement in the time resolution for following such changes.



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J. Appl. Cryst. (1995). 28, 14-19    [doi:10.1107/S0021889894006333]

Diffraction by Diffusely Scattering Materials of High Transparency

R. H. Bragg and J. B. Aladekomo

Synopsis: Simple methods are presented of correcting the wide-range X-ray diffraction patterns of diffusely scattering materials for distortion due to finite speciment length, high transparency, strong Compton scattering and contributions from small-angle scattering.



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J. Appl. Cryst. (1995). 28, 20-25    [doi:10.1107/S0021889894007788]

A Multilayer-Coated Diffraction-Grating Device for Polarized and Unpolarized Neutron Interferometry

M. Mâaza and B. Pardo

Synopsis: The use of multilayer coatings in the classical Ioffe diffraction-grating neutron interferometer is proposed. This interferometer combines the properties of two periodic structures: dispersion by a diffraction grating and high reflectivity because of the multilayer coating.



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J. Appl. Cryst. (1995). 28, 26-32    [doi:10.1107/S0021889894008320]

The Combination of Thermal Analysis and Time-Resolved X-ray Techniques: a Powerful Method for Materials Characterization

W. Bras, G. E. Derbyshire, A. Devine, S. M. Clark, J. Cooke, B. E. Komanschek and A. J. Ryan

Synopsis: A new differential thermal analyser has been developed suitable for combining with time-resolved X-ray equipment. The use of this instrument with simultaneous SAXS, SAXS/WAXS and energy-dispersive powder diffraction experiments is described.



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J. Appl. Cryst. (1995). 28, 33-37    [doi:10.1107/S0021889894007776]

Time-Resolved X-ray Diffraction Study of the Staging Phase Transition in CuCl2-Intercalated Graphite

K. F. van Malssen, P. Capková, H. Schenk and H. P. Boehm

Synopsis: A real-time X-ray diffraction study of staging phase transitions in CuCl2-intercalated graphite during deintercalation in ambient air has been carried out. A position-sensitive detector was used to perform the real-time quantitative phase analysis at different stages of the deintercalation reaction.



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J. Appl. Cryst. (1995). 28, 38-42    [doi:10.1107/S0021889894008319]

Akima Interpolation: a Tool used in Direct Slit-Length Desmearing Procedures of Non-Frequency-Limited X-ray Scattering Curves

J. J. Müller, E.-C. Müller, C. Gernat and R. Kröber

Synopsis: Direct slit-collimation correction of small-and wide-angle scattering data from semicrystalline materials on the basis of Akima polynomials and slit functions renders Soller-slit collimation unnecessary. A gain factor of four or five in scattered intensity results.



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J. Appl. Cryst. (1995). 28, 43-48    [doi:10.1107/S0021889894008824]

Spatial-Distortion Corrections, for Laue Diffraction Patterns Recorded on Image Plates, Modelled using Polynomial Functions

J. W. Campbell, M. M. Harding and B. Kariuki

Synopsis: A polynomial-based spatial-distortion correction, derived from the diffraction pattern, has been used to enable good spot-position prediction for processing Laue diffraction data recorded on an image plate.


short communications



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J. Appl. Cryst. (1995). 28, 49-52    [doi:10.1107/S0021889894009635]

Attenuation corrections for X-ray and neutron fibre diffraction studies

P. Langan, V. T. Forsyth and A. Mahendrasingam

Synopsis: The form of the transmission factor for sample geometries encountered in X-ray and neutron fibre diffraction studies is considered.


computer programs



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J. Appl. Cryst. (1995). 28, 53-56    [doi:10.1107/S0021889894009428]

XABS2: an empirical absorption correction program

S. Parkin, B. Moezzi and H. Hope

Synopsis: The paper describes an algorithm for an empirical post-solution absorption correction. Only Fobs and structural parameters (isotropic level) are required.


fast communications



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J. Appl. Cryst. (1995). 28, 57-60    [doi:10.1107/S0021889894010101]

High-resolution triple-crystal X-ray diffraction experiments performed at the Australian National Beamline Facility on a silicon sample with lateral periodic superstructure

A. Yu. Nikulin, A. W. Stevenson, H. Hashizume, S. W. Wilkins, D. Cookson, G. Foran and R. F. Garrett

Synopsis: An ion-implanted Si(111) sample with lateral periodic superstructure has been studied by high-resolution triple-crystal diffractometry at the Australian National Beamline Facility of the Photon Factory synchrotron. Detailed analysis of the data will yield a map, as a function of lateral position and depth, of the lattice distortions perpendicular to the sample surface.



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J. Appl. Cryst. (1995). 28, 61-64    [doi:10.1107/S0021889894011118]

A possible new route to precise lattice-parameter measurement of perfect crystals using the divergent-X-ray beam method

A. R. Lang and G. Pang

Synopsis: Fine-scale dark streaks, only a few arc seconds in angular width, are discovered within the area of overlap at Kossel-line intersections. They delineate loci of coherent multiple diffraction and impose potentially useful markers on the broad-line divergent-beam pattern.


computer program abstracts



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J. Appl. Cryst. (1995). 28, 65    [doi:10.1107/S0021889894010642]

SORTX - a program for on-screen stick-model editing and autosorting of SHELX files for use on a PC

P. McArdle

Synopsis: SORTX generates a stick model of the atoms or peaks in a SHELX file on a PC screen. Atoms are selected and renamed or deleted using the mouse.



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J. Appl. Cryst. (1995). 28, 65-66    [doi:10.1107/S0021889894010630]

PARSET and PARSYM - production of files for neutron powder structure refinement program MORGUE and solution/refinement program PARAM

P. G. Byrom and B. W. Lucas

Synopsis: Interactive computer programs (PARSET and PARSYM) are described that create input files for programs MORGUE and PARAM, which perform neutron powder structure refinement solution with rigid-body positional and thermal-motion constraints.


crystallographers



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J. Appl. Cryst. (1995). 28, 66    [doi:10.1107/S0021889894011830]

Crystallographers


international union of crystallography



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J. Appl. Cryst. (1995). 28, 66-67    [doi:10.1107/S0021889894014226]

Nominations for the Ewald Prize


notes and news



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J. Appl. Cryst. (1995). 28, 67    [doi:10.1107/S0021889895099687]

Notes and News


new commercial products



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J. Appl. Cryst. (1995). 28, 67-68    [doi:10.1107/S0021889895099675]

New Commercial Products


books received



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J. Appl. Cryst. (1995). 28, 68    [doi:10.1107/S0021889895099663]

Handbook of crystal growth. Vol. 1: Fundamentals. a: thermodynamics and kinetics; b: transport and stability edited by D. T. J. Hurle



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J. Appl. Cryst. (1995). 28, 68    [doi:10.1107/S0021889895099651]

Accuracy in powder diffraction II edited by E. O. Prince and J. K. Stalick



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J. Appl. Cryst. (1995). 28, 68    [doi:10.1107/S002188989509964X]

Out of the crystal maze. Chapters from the history of solid-state physics edited by L. Hoddeson, E. Braun, J. Teichmann and S. Weart



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J. Appl. Cryst. (1995). 28, 68    [doi:10.1107/S0021889895099638]

Random, non-random and periodic faulting in crystals by M. T. Sebastian and P. Krishna


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