Journal of Applied Crystallography
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Figure 8
Spatial profile of the beam at the detector with the multilamella analyzer set at peak intensity under conditions of `thickness focusing'.
JOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 33
|
Part 1
|
February 2000
|
Pages 147-155
doi:10.1107/S0021889899012947
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