issue contents

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767

June 2000 issue

Proceedings of the XIth International Conference on Small-Angle Scattering

Brookhaven National Laboratory, 17-20 May 1999

Highlighted illustration

Cover illustration: Reorientation pathways of the octahedral PF6 anion in KPF6, calculated by an evolution algorithm. Courtesy of K. Knorr (University Kiel, Earth Sciences - Mineralogy) and Fritz Mädler (HMI Berlin).



research papers


J. Appl. Cryst. (2000). 33, 421-423
doi: 10.1107/S0021889899014375






J. Appl. Cryst. (2000). 33, 447-450
doi: 10.1107/S0021889899015411

J. Appl. Cryst. (2000). 33, 451-455
doi: 10.1107/S0021889800099970

J. Appl. Cryst. (2000). 33, 456-460
doi: 10.1107/S0021889899016258


J. Appl. Cryst. (2000). 33, 465-468
doi: 10.1107/S0021889800099969

J. Appl. Cryst. (2000). 33, 469-472
doi: 10.1107/S0021889899014855


J. Appl. Cryst. (2000). 33, 478-482
doi: 10.1107/S0021889899014284

J. Appl. Cryst. (2000). 33, 483-487
doi: 10.1107/S0021889899014727


J. Appl. Cryst. (2000). 33, 492-495
doi: 10.1107/S002188989901688X



J. Appl. Cryst. (2000). 33, 504-506
doi: 10.1107/S0021889899014466


J. Appl. Cryst. (2000). 33, 511-514
doi: 10.1107/S0021889800099945





J. Appl. Cryst. (2000). 33, 530-534
doi: 10.1107/S0021889800001370





J. Appl. Cryst. (2000). 33, 552-555
doi: 10.1107/S0021889800097983



J. Appl. Cryst. (2000). 33, 565-568
doi: 10.1107/S0021889800001345

J. Appl. Cryst. (2000). 33, 569-573
doi: 10.1107/S0021889899013680






J. Appl. Cryst. (2000). 33, 597-599
doi: 10.1107/S0021889899013448

J. Appl. Cryst. (2000). 33, 600-604
doi: 10.1107/S0021889899012224



J. Appl. Cryst. (2000). 33, 614-617
doi: 10.1107/S0021889899012236

J. Appl. Cryst. (2000). 33, 618-622
doi: 10.1107/S0021889899012753




J. Appl. Cryst. (2000). 33, 637-640
doi: 10.1107/S0021889899012248


J. Appl. Cryst. (2000). 33, 645-649
doi: 10.1107/S0021889899013138


J. Appl. Cryst. (2000). 33, 653-656
doi: 10.1107/S0021889899013679

J. Appl. Cryst. (2000). 33, 657-658
doi: 10.1107/S0021889899013217

J. Appl. Cryst. (2000). 33, 659-663
doi: 10.1107/S002188989901328X

J. Appl. Cryst. (2000). 33, 664-668
doi: 10.1107/S0021889899013266

J. Appl. Cryst. (2000). 33, 669-672
doi: 10.1107/S0021889899013278

J. Appl. Cryst. (2000). 33, 673-676
doi: 10.1107/S0021889899013308






J. Appl. Cryst. (2000). 33, 700-703
doi: 10.1107/S0021889899013254

J. Appl. Cryst. (2000). 33, 704-708
doi: 10.1107/S0021889899013291




J. Appl. Cryst. (2000). 33, 723-726
doi: 10.1107/S0021889899015009



J. Appl. Cryst. (2000). 33, 735-739
doi: 10.1107/S002188980009988X


J. Appl. Cryst. (2000). 33, 744-748
doi: 10.1107/S0021889800099866

J. Appl. Cryst. (2000). 33, 749-752
doi: 10.1107/S0021889800099854



J. Appl. Cryst. (2000). 33, 763-766
doi: 10.1107/S0021889899013783

J. Appl. Cryst. (2000). 33, 767-770
doi: 10.1107/S0021889800099829