Volume 34 
Part 1 
Page 87  
February 2001  

A new version of the method for analysing peak broadening caused by local tilt distribution in double-crystal X-ray diffraction measurements. Erratum

As a result of a printer's error, Fig. 9 of the paper by Nakashima [J. Appl. Cryst. (2000), 33, 1376-1385 ] was incorrectly printed. The correct figure is given here.

Figure 9 Result of the new analysis method when applied to the minus-first-order satellite peaks in the = 270° profiles shown in Fig. 7. (a) Three different hkl profiles obtained after rescaling of the horizontal axis by cosc. Each peak position is shifted to the origin. In other words, = - (reference peak) and (minus-first-order satellite peak) is adopted as the (reference peak). (b) The three profiles in (a) replotted by adjusting their peak intensity tops to that of 004 in order to examine more accurately whether the three profiles are the same or not. The background level for each hkl profile is also indicated in (a) and (b). Only the signals above the background levels are significant for the comparison.