view article
Figure 2
Distance profile, in an Fe/GaAs (001) sample, which best fits the experimental X-ray diffraction data (see Fig. 3[link]).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 36| Part 1| February 2003| Pages 154-157
https://doi.org/10.1107/S0021889802019866
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS