Structural characterization of thin films of the SrBi2Nb2O9 ferroelectric Aurivillius phase epitaxially grown on (110)SrTiO3

Duclère, J.-R.; Guilloux-Viry, M.; Perrin, A.

doi:10.1107/S0021889802020095

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 4
A scheme of the bi-epitaxial growth of the two families, labelled A and B: (a) the model (116)_F || (110)_S; (b) growth on {100}_S facets. For clarity, the half-volume subcell based on SBN perovskite blocks (meaning a and b = a_SBN2^1/2/2 and b_SBN2^1/2/2) has been drawn.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 36| Part 1| February 2003| Pages 96-102

https://doi.org/10.1107/S0021889802020095

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