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Figure 5
XRD patterns in texture mode (φ scans) of (a) the substrate as reference, (b) a single-family (116)SBN grown on the substrate, (c) a two-equiprobable-families film, and (d) an intermediate case. Note that the φ origin is arbitrary and azimuthal comparison is significant only for patterns (a) and (b).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 36| Part 1| February 2003| Pages 96-102
https://doi.org/10.1107/S0021889802020095
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