Structural characterization of thin films of the SrBi2Nb2O9 ferroelectric Aurivillius phase epitaxially grown on (110)SrTiO3

Duclère, J.-R.; Guilloux-Viry, M.; Perrin, A.

doi:10.1107/S0021889802020095

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 8
Scheme of the twin boundary of the two families A and B viewed along the [001]_S substrate direction, highlighting the importance of the (11 $[\bar{7}]$ ) plane. Oxygen atoms have been removed for clarity.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 36| Part 1| February 2003| Pages 96-102

https://doi.org/10.1107/S0021889802020095

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