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Figure 5
(a) Centred dark-field TEM image showing θ′-phase particles. (b) Related composite diffraction pattern recorded along the [001] zone axis of the ferritic matrix. The reflections with a low intensity belong to the θ′ phase. The reflection at half the distance between 000 and 020 is used for the dark-field image.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 36| Part 1| February 2003| Pages 103-108
https://doi.org/10.1107/S0021889802020101
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