Figure 3 The integrated intensity (solid symbols) and background (open symbols) count rates (normalized by Vv) and the associated predictions (continuous and dashed lines, respectively) for depth scans on (a) Al (311), (b) Ti (101), (c) Fe (200) and (211), and (d) Ni (111) recorded in reflection geometry on ID31 at 60  keV (ESRF). The data represented by square symbols were collected during the same beam period and are modelled by the bolder lines. The other data were collected at various times during the previous 15 months. The instr, 0 and sample instrumental parameters were obtained from the Ni data. The path lengths have been normalized by the respective attenuation lengths.

© International Union of Crystallography 2004