Journal of Applied Crystallography

Volume 38, Part 3 (June 2005)

research papers

J. Appl. Cryst. (2005). 38, 512-519 [ doi:10.1107/S0021889805009234 ]

Advances in digital topography for characterizing imperfections in protein crystals

J. J. Lovelace, C. R. Murphy, H. D. Bellamy, K. Brister, R. Pahl and G. E. O. Borgstahl

Abstract: A system which joins digital topography with fine [varphi] -sliced reflection profiling has been developed and applied to cryocrystallography. In this demonstration, fifteen fine -sliced reflection profiles with corresponding topographic sequences are evaluated: twelve reflections from a crystal at cryogenic temperatures and three reflections from a room-temperature crystal. The digitally collected data show results comparable with film, albeit at a lower resolution, but are acquired at a substantially higher rate. Additionally, anti-blooming circuitry in the CCD was tested and shown to provide useful data even when pixels were overloaded.

Keywords: topography; mosaicity; crystal quality; cryocrystallography; macromolecular crystallography; reflection profiles; cryocooling.


	Portable Document Format (PDF) file Detailed Topography Processing Example

	Portable Document Format (PDF) file Repeatability Results with Cryo and RT

	Portable Document Format (PDF) file Comparison of Digital Topographs with Film

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