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Figure 3
Rietveld refinement of an Rb[MnCr(CN)6].xH2O/Si mixture recorded at 16 K. Observed data are in red, calculated in blue. The strong peaks at ∼38, ∼45 and ∼83° 2θ are due to the Al sample holder and fitted using the Pawley method (note that the data are presented on an I 0.5 scale to emphasize the weak sample peaks). The lowest tick marks are Al peaks, the middle tick marks are for the sample, and the upper tick marks the Si internal standard.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 40| Part 1| January 2007| Pages 87-95
doi:10.1107/S0021889806043275
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