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Cover illustration: Two-dimensional grazing-incidence X-ray scattering pattern for a PS-b-PI thin film deposited on a silicon substrate. Courtesy of Sangwoo Jin et al. [J. Appl. Cryst. (2007), 40, 950-958]. |
J. Appl. Cryst. (2008). 41, 491-522 [ doi:10.1107/S0021889808007279 ]
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J. Appl. Cryst. (2008). 41, 523-530 [ doi:10.1107/S0021889808005098 ]
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J. Appl. Cryst. (2008). 41, 531-536 [ doi:10.1107/S0021889808005463 ]
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J. Appl. Cryst. (2008). 41, 537-543 [ doi:10.1107/S0021889808005943 ]
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J. Appl. Cryst. (2008). 41, 544-547 [ doi:10.1107/S0021889808007309 ]
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J. Appl. Cryst. (2008). 41, 548-553 [ doi:10.1107/S002188980800945X ]
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J. Appl. Cryst. (2008). 41, 554-562 [ doi:10.1107/S0021889808007905 ]
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J. Appl. Cryst. (2008). 41, 563-571 [ doi:10.1107/S0021889808006444 ]
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J. Appl. Cryst. (2008). 41, 572-583 [ doi:10.1107/S0021889808006894 ]
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J. Appl. Cryst. (2008). 41, 584-591 [ doi:10.1107/S0021889808008649 ]
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J. Appl. Cryst. (2008). 41, 592-599 [ doi:10.1107/S0021889808011527 ]
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J. Appl. Cryst. (2008). 41, 600-605 [ doi:10.1107/S0021889808010716 ]
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J. Appl. Cryst. (2008). 41, 606-614 [ doi:10.1107/S0021889808012491 ]
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J. Appl. Cryst. (2008). 41, 615-627 [ doi:10.1107/S0021889808012223 ]
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J. Appl. Cryst. (2008). 41, 628-633 [ doi:10.1107/S0021889808012648 ]
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J. Appl. Cryst. (2008). 41, 634-636 [ doi:10.1107/S0021889808005876 ]
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J. Appl. Cryst. (2008). 41, 637-640 [ doi:10.1107/S0021889808006481 ]
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J. Appl. Cryst. (2008). 41, 641-643 [ doi:10.1107/S0021889808006985 ]
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J. Appl. Cryst. (2008). 41, 644-646 [ doi:10.1107/S0021889808007966 ]
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J. Appl. Cryst. (2008). 41, 647-652 [ doi:10.1107/S0021889808008625 ]
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J. Appl. Cryst. (2008). 41, 653-658 [ doi:10.1107/S0021889808012016 ]
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J. Appl. Cryst. (2008). 41, 659 [ doi:10.1107/S0021889808008832 ]
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J. Appl. Cryst. (2008). 41, 660-662 forthcoming meetings and short courses |
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