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Cover illustration: Two-dimensional grazing-incidence X-ray scattering pattern for a PS-b-PI thin film deposited on a silicon substrate. Courtesy of Sangwoo Jin et al. [J. Appl. Cryst. (2007), 40, 950-958]. |
J. Appl. Cryst. (2008). 41, 663-668 [ doi:10.1107/S0021889808014994 ]
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J. Appl. Cryst. (2008). 41, 669-674 [ doi:10.1107/S0021889808014386 ]
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J. Appl. Cryst. (2008). 41, 680-689 [ doi:10.1107/S0021889808013046 ]
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J. Appl. Cryst. (2008). 41, 690-694 [ doi:10.1107/S0021889808018025 ]
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J. Appl. Cryst. (2008). 41, 695-700 [ doi:10.1107/S0021889808017883 ]
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J. Appl. Cryst. (2008). 41, 701-704 [ doi:10.1107/S0021889808019092 ]
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J. Appl. Cryst. (2008). 41, 705-714 [ doi:10.1107/S0021889808013277 ]
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J. Appl. Cryst. (2008). 41, 715-722 [ doi:10.1107/S0021889808015021 ]
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J. Appl. Cryst. (2008). 41, 723-728 [ doi:10.1107/S002188980801265X ]
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J. Appl. Cryst. (2008). 41, 729-737 [ doi:10.1107/S0021889808011898 ]
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J. Appl. Cryst. (2008). 41, 738-746 [ doi:10.1107/S002188980801279X ]
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J. Appl. Cryst. (2008). 41, 747-753 [ doi:10.1107/S0021889808015768 ]
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J. Appl. Cryst. (2008). 41, 754-760 [ doi:10.1107/S0021889808012417 ]
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J. Appl. Cryst. (2008). 41, 761-767 [ doi:10.1107/S0021889808016609 ]
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J. Appl. Cryst. (2008). 41, 768-775 [ doi:10.1107/S0021889808018256 ]
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J. Appl. Cryst. (2008). 41, 776-783 [ doi:10.1107/S0021889808019365 ]
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J. Appl. Cryst. (2008). 41, 784-790 [ doi:10.1107/S0021889808020074 ]
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J. Appl. Cryst. (2008). 41, 791-797 [ doi:10.1107/S0021889808018451 ]
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J. Appl. Cryst. (2008). 41, 800-802 [ doi:10.1107/S002188980801635X ]
-cristobalite dendrites: an electron backscatter diffraction study |
J. Appl. Cryst. (2008). 41, 803-807 [ doi:10.1107/S0021889808016373 ]
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J. Appl. Cryst. (2008). 41, 808-810 [ doi:10.1107/S002188980801385X ]
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J. Appl. Cryst. (2008). 41, 815-817 [ doi:10.1107/S0021889808016956 ]
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J. Appl. Cryst. (2008). 41, 818-821 [ doi:10.1107/S0021889808015999 ]
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J. Appl. Cryst. (2008). 41, 826-827 [ doi:10.1107/S0021889808015987 ]
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J. Appl. Cryst. (2008). 41, 828-830 forthcoming meetings and short courses |
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