Investigation of indirect structural and chemical parameters of GeSi nanoparticles in a silica matrix by combined synchrotron radiation techniques

Gasperini, A.; Malachias, A.; Fabbris, G.; Kellermann, G.; Gobbi, A.; Avendaño, E.; Azevedo, G. de M.

doi:10.1107/S0021889811049302

Figure 8
Single- and multiple-scattering paths included in the analysis of the Ge bulk standard and GeSi nanocrystals Paths lengths and relative amplitudes are indicated in Table 3

. The absorbing atom is indicated in red. The first, second, third and fourth neighbors are drawn in green, blue, yellow and purple, respectively.