Figure 2
GISAXS patterns measured with X-rays with photon energies of (a) 12.4 keV, (b) 1.770 keV and (c) 1.837 keV. The positions marked by broken lines correspond to calculated (1) kiz + kcz(Si) and (2) kiz + kcz(SEBS) and (3) both.  [article HTML]

© International Union of Crystallography 2012