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Figure 3
Integrated validation application, showing a list of outliers for all-atom contact analysis, and the multi-criterion plot combining geometry outliers, electron-density levels and B factors. The model, maps and Probe dots (Word et al., 1999BB41) are automatically loaded into Coot, and the view is re-centered on the selected atom.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 45| Part 3| May 2012| Pages 581-586
doi:10.1107/S0021889812017293
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