Diffraction/scattering computed tomography for three-dimensional characterization of multi-phase crystalline and amorphous materialsThis article forms part of a special issue dedicated to advanced diffraction imaging methods of materials, which will be published as a virtual special issue of the journal in 2013.

Álvarez-Murga, M.; Bleuet, P.; Hodeau, J.-L.

doi:10.1107/S0021889812041039

Figure 3
Sample rotation ( [omega]

) and scanning (y) setup for a DSCT experiment. A monochromatic pencil X-ray beam illuminates the sample at different positions along the scanning direction (y) and a series of high-resolution two-dimensional diffraction patterns (2 [theta]

) averaged along the beam path are recorded at several projection angles ( [omega]