Diffraction/scattering computed tomography for three-dimensional characterization of multi-phase crystalline and amorphous materialsThis article forms part of a special issue dedicated to advanced diffraction imaging methods of materials, which will be published as a virtual special issue of the journal in 2013.

Álvarez-Murga, M.; Bleuet, P.; Hodeau, J.-L.

doi:10.1107/S0021889812041039

Figure 7
Schematic illustration of sinograms showing three possible incomplete data schemes: (a) missing angular information produces severe artefacts in the reconstructed images; alternatively, data may be (b) truncated or (c) missing inside the object.