Figure 5
(a) Measured (open circles) and fitted (line; red in the electronic version of the journal) patterns of the specimen deformed at RT and measured on the ND surface. The difference between the measured and fitted data is shown at the bottom of the figure. (b) Enlarged sections of the measured (open circles) and fitted (red lines) patterns, with logarithmic intensity scales, of the specimens deformed at RT, 473 K and 673 K obtained on the ND surfaces. The pattern sections are shifted vertically for clear distinction. `Ma' or `R' at the hkl values indicate that the reflection corresponds to the major or random texture component, respectively. [The Ma/R labels are never shown redundantly. In (b) about 80% of the data points have been omitted for the purpose of clarity.]  [article HTML]

© International Union of Crystallography 2013