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Figure 3
Schematic view of the small size of the measurement parallax along the beam as a result of the much greater distance from the profiler to the detector pixels than from the profiler to the microbeam. Adapted from Yang, Larson, Tischler et al. (2004BB71) with permission.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 1| December 2013| Pages 153-164
doi:10.1107/S0021889812043737
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