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Figure 4
Schematic illustration depicting the result of reconstructing the polychromatic Laue diffraction patterns as a function of depth along the beam by differential-aperture depth profiling and subsequent collation of difference images calculated between successive steps of the profiler wire. The depth-integrated random-like spot pattern becomes a series of single-crystal Laue patterns corresponding to the grain at that depth. Adapted from Larson et al. (2002BB26) with permission.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 1| December 2013| Pages 153-164
doi:10.1107/S0021889812043737
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