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Figure 6
Photographs of a 42 µm-thick silicon plate bent elastically to a 5 mm radius (a) and a 25 µm-thick silicon plate bent plastically by heating to 973 K under bending stress (b). The left side of the figure shows micrometre-resolution spatially resolved measurements of dislocation tensor components for (a) the elastically bent silicon plate and (b) the plastically bent silicon plate. Within statistical uncertainties, the elastically bent case (a) has no GNDs. The plastically bent case (b) indicates strong bands (red) of GNDs in the αxy component and smaller density distributions (blue and red) in the αxz component. Weaker but nonzero densities are visible in the remaining components as well. The dashed lines in the αxy component of (b) correspond to two of the {111} plane traces, indicating that the plastic deformation is concentrated largely on these slip directions. The full-scale magnitudes of the GNDs in the color scale correspond to ρ = 0.95 × 109 cm−2. Adapted from Larson et al. (2008BB25) with permission.

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