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Figure 4
X-ray transmission projection topograph (a) and optical micrograph (in transmission geometry) (b) for the same group of defects in sample A of the SLG crystals [region C marked in Fig. 1[link](a)]. (c)–(e) Optical micrographs for a chosen defect taken by focusing the microscope at different crystal depths.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 1| January 2013| Pages 48-54
doi:10.1107/S0021889812050522
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