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Figure 10
Monochromatic X-ray section topographs of a Friedel pair of a grain embedded in a polycrystalline Al–Li sample, acquired with a horizontal rotation and vertical detector (2θ ≃ 90°) axis. The images were acquired using the same setup and sample as shown in Fig. 9[link](b).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 2| March 2013| Pages 297-311
doi:10.1107/S0021889813002604
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