view article
Figure 8
Layout of the setup for combining DCT and section topography with a horizontal rotation axis and vertical detector. An absorption mask provides the line beam illumination on the sample. The irradiated section of the grain is projected almost perpendicularly (2θ ≃ 90°) onto the detector plane. An inline detector on which the section appears compressed as it diffracts is also shown for comparison. Grain maps can be acquired by either detector.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 2| March 2013| Pages 297-311
doi:10.1107/S0021889813002604
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS