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Figure 2
(a) Noise-free oversampled diffraction pattern of the Lena model. (b) Oversampled diffraction pattern of the Lena model with Poisson noise (Rnoise = 15%). (c) Lena model with an inset showing fine features. Final reconstructions of the Lena model obtained from the noisy diffraction pattern shown in (b) by using (d) HIO, (e) ER–HIO, (f) NR–HIO and (g) OSS.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 2| February 2013| Pages 312-318
doi:10.1107/S0021889813002471
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