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Figure 4
The observed, calculated and difference XPD profiles of SU-66 for Rietveld refinement, shown in black, green and blue, respectively (λ = 0.413151 Å). Intensities have been scaled up by a factor of 10 above 2θ = 4° for clarity (Grässlin, 2013BB19).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 4| June 2013| Pages 1094-1104
doi:10.1107/S0021889813013101
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