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Figure 1
AFM images of (a) CaF2(111), (b) CaF2(001) and (c) CaF2(110) layers on Si.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 4| June 2013| Pages 874-881
doi:10.1107/S0021889813008777
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