view article

Figure 1
Measured rocking curves for the Si0.4Ge0.6 epilayers on Si substrates with thicknesses of 2–6 nm around the 004 Bragg reflection.

Journal logoJOURNAL OF
ISSN: 1600-5767
Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds