Figure 1
X-ray elastic strains were characterized using the [\sin^{{2}}\psi] method by measuring lattice spacing d(hkl) at different sample tilt angles [psi] along the direction of the diffraction vector [{ {\bf Q}}]. The angle [psi] represents the angle between the sample normal [{{\bf n}}] and [{{\bf Q}}]. By varying the angle [psi], the X-ray penetration depth [tau] was tuned (Hauk, 1997BB13; Birkholz, 2006BB2).  [article HTML]