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![[Figure 5]](ay5476fig5mag.jpg)
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Figure 5
(a) Schematic of the numerical calculation of scattering parameter means and standard deviations for individual pixels weighted over the direct-beam intensity (left hand image) – in this work a region 8 × 8 pixel is shown. Scattering observed at a pixel in the scattering data (right hand image) will be a similarly weighted combination of scattering from each of these possible centers and therefore a Gaussian sampling of the scattering function around the same mean value of the scattering parameter and with an integration width (resolution) of its standard deviation may be used to account for the effects of finite incident-beam size. As shown φ is the angle for a given pixel from the x axis on a coordinate system (x, z) with origin at the mean center of the direct-beam image. (b) Direct-beam image beam profiles versus x and z pixels summed over a transverse band 8 pixels wide in linear and log–lin plots. The 8 × 8 pixel region can be seen to contain the direct-beam image down about ∼0.1% of the peak intensity. Some of our data were analyzed only down to the 1% level, i.e. using a 6 × 6 pixel beam region; this did not significantly change the values derived from analysis of the scattering data. |
![[Figure 5]](ay5476fig5.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
