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Figure 5
Fit of the scattering model (solid line) to the experimental SANS profiles. The profiles are shifted vertically for better clarity. The inset shows the profiles on an absolute scale.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 47| Part 1| February 2014| Pages 421-429
doi:10.1107/S1600576713033463
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