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Figure 10
Measured polarization of the reflected beam and amplitude fit on a stack of Si(100) wafers of dimension 50 × 0.3 mm (diameter × thickness). The scattering angle of 84° was twice the inclination angle (42°) of the precession region. The colours and insets refer to the different B fields and resonance frequencies used in the precession region. The lower two figures show P(φ) in two small φ ranges at different B values in mT according to the key shown in the inset.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 47| Part 1| February 2014| Pages 436-442
doi:10.1107/S1600576713033839
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