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Figure 9
–sin2Ψ plot of the Ni(W)–wafer film, using the CGM with unaffected reflections at the rotation angle φ = 0° (black solid line) and using the unaffected 111 reflection at Ψ = 0° and the affected 11[\overline 1] reflection at Ψ = 70.53° (red dashed line).

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