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Figure 3
Superposition of XMT and XDT reconstructions of a silver behenate phantom. (a) XMT scan (grayscale image in the background, voxel size 3.8 µm) and XDT reconstruction (transparent-to-yellow overlay, voxel size 100 µm) of the sample, consisting of two silver behenate particles. The XMT reconstruction has sufficient resolution to also visualize impurities or aggregates within the particles, seen as bright spots in the grayscale image. The scale bar is 200 µm. (b) X-ray diffraction pattern corresponding to the beam path indicated by the upper arrow in (a). The strength of the silver behenate 001 reflection (integrated intensity within the white box) was used as the projection variable for the XDT reconstruction. (c) X-ray diffraction pattern corresponding to the lower arrow in (a).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 47| Part 1| February 2014| Pages 471-475
doi:10.1107/S1600576713031105
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