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Figure 5
Intensity profiles by dynamical simulation of MD [{\overline 3}17 + 3{\overline 1}1], primary reflection 008. X-ray energy of 8.374 keV in σ polarization. (a), (b) NSH structure with a slab thickness of (a) 1 µm and (b) 200 µm. (c), (d) NSH:Mg structure (12% doping, UO2- = 0.0625 Å2) with a slab thickness of (c) 1 µm and (d) 200 µm. Invariant phases, Ψ, are indicated beside each profile.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 47| Part 1| February 2014| Pages 160-165
doi:10.1107/S1600576713028677
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