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Figure 2
(a) AFM image of non-overlapping ion tracks on a rutile TiO2 (001) surface (50 ion tracks per µm2, image height scale 4 nm, inset ×2 magnification). GISAXS maps of the irradiated surface acquired at (b) β = 0° and (c) β = 5°. The corresponding simulations of the GISAXS maps are shown as insets in (b) and (c). The simulations are generated using the parameters of the fit.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 49| Part 5| October 2016| Pages 1704-1712
https://doi.org/10.1107/S1600576716013704
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