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Journal logoJOURNAL OF
SYNCHROTRON
RADIATION
Volume 2| Part 1
ISSN: 1600-5775

January 1995 issue

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Cover illustration: System used for texture mapping at the BL-3A beamline at the Photon Factory, see Kawaski & Iwasaki, pages 49-55.

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J. Synchrotron Rad. (1995). 2, 1-5
doi: 10.1107/S090904959400957X
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Adaptive Silicon Monochromators for High-Power Insertion Devices. Tests at CHESS, ESRF and HASYLAB

J. P. Quintana, M. Hart, D. Bilderback, C. Henderson, D. Richter, T. Setterston, J. White, D. Hauserman, M. Krumrey and H. Schulte-Schrepping
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J. Synchrotron Rad. (1995). 2, 6-12
doi: 10.1107/S0909049594009763
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Fixed-Exit Monochromators for High-Energy Synchrotron Radiation

P. Suortti and C. Schulze
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J. Synchrotron Rad. (1995). 2, 13-21
doi: 10.1107/S0909049594007405
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Imaging Plates for Use with Synchrotron Radiation

Y. Amemiya
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J. Synchrotron Rad. (1995). 2, 22-26
doi: 10.1107/S0909049594009180
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Image-Plate Synchrotron Laue Data Collection and Subsequent Structural Analysis of a Small Test Crystal of a Nickel-Containing Aluminophosphate

E. Snell, J. Habash, M. Helliwell, J. R. Helliwell, J. Raftery, V. Kaucic and J. W. Campbell
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J. Synchrotron Rad. (1995). 2, 27-30
doi: 10.1107/S0909049594009660
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Evaluation of Reflection Intensities for the Components of Multiple Laue Diffraction Spots. III. Using a Real-Space Density Modification Method

Q. Hao, M. M. Harding and J. W. Campbell
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J. Synchrotron Rad. (1995). 2, 31-35
doi: 10.1107/S0909049594009854
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Polarized Dispersion for X-rays Scattered by an Aromatic Bromide

L. K. Templeton and D. H. Templeton
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J. Synchrotron Rad. (1995). 2, 36-48
doi: 10.1107/S0909049594006680
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The Multiwavelength Anomalous Solvent Contrast (MASC) Method in Macromolecular Crystallography

R. Fourme, W. Shepard, R. Kahn, G. l'Hermite and I. Li de La Sierra
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J. Synchrotron Rad. (1995). 2, 49-55
doi: 10.1107/S0909049594011374
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Rapid Mapping of Texture in Polycrystalline Materials Using an Imaging Plate on a Synchrotron Radiation Source

K. Kawasaki and H. Iwasaki
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J. Synchrotron Rad. (1995). 2, 56-63
doi: 10.1107/S0909049594009179
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Interpretation of EXAFS Data

S. J. Gurman
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J. Synchrotron Rad. (1995). 2, 64-69
doi: 10.1107/S0909049594010861
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Quick Fluorescence-EXAFS: an Improved Method for Collection of Conventional XAFS Data, an Improved Method for Collection of Conventional XAFS Data and for Studying Reaction Intermediates in Dilute Systems

L. M. Murphy, B. R. Dobson, M. Neu, C. A. Ramsdale, R. W. Strange and S. S. Hasnain
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international union of crystallography

J. Synchrotron Rad. (1995). 2, 70-74
doi: 10.1107/S0909049595099456
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Notes for Authors

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new commercial products

J. Synchrotron Rad. (1995). 2, 76
doi: 10.1107/S0909049595099432
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New Commercial Products

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