January 1999 issue
A solft X-ray beam-position monitor based on a CVD diamond photodetector is presented, for use on low-energy monochromatic beamlines. It allows monitoring of beam instabilities during experiments towards simultaneous compensation.
This paper describes the design concept of a multiple-CCD X-ray detector as well as the initial performance test carried out with a conventional X-ray generator system.
Ab initio structure determination of three organic compounds prove that the Laue method can be used as a stand-alone technique for X-ray analysis.
Hybrid reflections appearing in the high-resolution sychrotron-radiation Renninger scans have been used to observe the break in the lattice coherence for the InGaP/GaAs heterostructure system.
A comparative analysis of the K, L3, L2 and L1 edges of Ce in CeO2 has been made and a procedure for obtaining structural parameters from L3-edge EXAFS has been developed.
At 11.0 GPa the diamond-type structure changes in the high-pressure phase with an increse in coordination numbers, and prolonged bonding distances make the magnitudes of σ(2) larger.
A fast (∼12 ms) shutter for UHV beamlines is described. In the closed position the beam is blocked by an electrically isolated aluminium piece. The total yield photocurrent in this situation can be used to monitor the beam intensity.