issue contents

Journal logoJOURNAL OF
ISSN: 1600-5775

January 2002 issue

Highlighted illustration

Cover illustration: High-resolution channel-cut monolithic monochromator used as an energy-selective device for studying lattice spacings of single crystals, see Obaidur, pages 28-35.

facility information

lead articles

J. Synchrotron Rad. (2002). 9, 1-8
doi: 10.1107/S0909049501018465
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This article, now updated, was originally published in Indian J. Phys. [(2001), A84, 1–11] which in turn was based on the Professor K. Banerjee Birth Centennial Medal lecture of the author given in Calcutta in September 2000.

research papers

J. Synchrotron Rad. (2002). 9, 9-16
doi: 10.1107/S0909049501020374
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A unfied approach is presented for calculating magnetic and natural dichroism (both circular and linear) in (spin-resolved) photoemission and absorption, valid in the many-body case and for extended systems. The reduction of this scheme to the independent particle approach describes these spectroscopies within the framework of multiple-scattering theory.

J. Synchrotron Rad. (2002). 9, 17-23
doi: 10.1107/S0909049501019203
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The 57Fe Mössbauer wavelength standard is used to measure the lattice constants of Al2O3, as well as the wavelengths of the 151Eu, 119Sn and 161Dy Mössbauer radiation.

J. Synchrotron Rad. (2002). 9, 24-27
doi: 10.1107/S0909049501021045
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Extended X-ray absorption fine structure experiments can be performed at extremely high energies (>50 keV) by using multiple-order reflections from the monochromator. Examples show that, notwithstanding the considerable core-hole broadening of the spectra, quantitative data can be extracted both from bulk and diluted samples.

J. Synchrotron Rad. (2002). 9, 28-35
doi: 10.1107/S0909049501018994
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Since synchrotron radiation has no characteristic (wavelength) spectral lines, a (+, +) high-resolution channel-cut monolithic monochromator has been introduced as an energy-selective device for the study of the lattice spacing of single crystals. Using two types of monolithic monochromator, two systems are proposed and applied to the high-precision measurement of the lattice spacing of Si wafers. The system can be applied for a fast and precise measurement of the lattice-spacing changes due to the doping in Si, GaAs and other single crystals.

J. Synchrotron Rad. (2002). 9, 36-43
doi: 10.1107/S0909049501020143
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The 49 × 86 mm 28 Mpixel detector discriminates single X-ray photons, has a large dynamic range, and a computer-controlled readout system that allows multiple pixel binning schemes and flexible operation in time-resolved experiments.

J. Synchrotron Rad. (2002). 9, 44-46
doi: 10.1107/S0909049501019215
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Compact high-power absorbers and diamond windows have been tested and installed on undulator-based ESRF front ends. The absorber has been tested at a peak power density of 1200 W mm−2 at normal incidence.

current events

J. Synchrotron Rad. (2002). 9, 47
doi: 10.1107/S0909049501020957

J. Synchrotron Rad. (2002). 9, 47
doi: 10.1107/S0909049501020969

J. Synchrotron Rad. (2002). 9, 47
doi: 10.1107/S0909049501020970

J. Synchrotron Rad. (2002). 9, 47
doi: 10.1107/S0909049501020994

J. Synchrotron Rad. (2002). 9, 48
doi: 10.1107/S0909049501020982

J. Synchrotron Rad. (2002). 9, 48
doi: 10.1107/S0909049501021008

J. Synchrotron Rad. (2002). 9, 48
doi: 10.1107/S090904950102101X

international union of crystallography

J. Synchrotron Rad. (2002). 9, 49-56
doi: 10.1107/S0909049501019501

J. Synchrotron Rad. (2002). 9, 57
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