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Cover illustration: The reflected amplitude on the ![]() plane of circularly polarized incident radiation in the study of the time dependence of the polarization of short X-ray pulses after crystal reflection, see Graeff, pages 293-297. |
J. Synchrotron Rad. (2002). 9, 277-281 [ doi:10.1107/S090904950201350X ] Large-area phase-contrast X-ray imaging using a two-crystal X-ray interferometerA. Yoneyama, A. Momose, I. Koyama, E. Seya, T. Takeda, Y. Itai, K. Hirano and K. HyodoSynopsis: The development and successful operation of a large-area (25 × 20 mm) phase-contrast X-ray imaging system using a two-crystal X-ray interferometer is reported. Online 31 August 2002 |
J. Synchrotron Rad. (2002). 9, 282-286 [ doi:10.1107/S0909049502010294 ] X-ray diffraction topography using a diffractometer with a bendable monochromator at a synchrotron radiation sourceD. Altin, J. Härtwig, R. Köhler, W. Ludwig, M. Ohler and H. KleinSynopsis: A versatile bendable monochromator double-crystal diffractometer was constructed, to investigate, using synchrotron radiation, single-crystal samples with high strain sensitivity and without any reduced image sizes. It is based on a local adaptation of Bragg angles between monochromator and sample. Online 31 August 2002 |
J. Synchrotron Rad. (2002). 9, 287-292 [ doi:10.1107/S0909049502011226 ] Diffuse scattering from liquid solutions with white-beam undulator radiation for photoexcitation studiesA. Plech, R. Randler, A. Geis and M. WulffSynopsis: The natural bandwidth of a single-line undulator is used to measure solution scattering and optimize flux requirements for laser-pump-X-ray-probe time-resolved excitation studies. Online 31 August 2002 |
J. Synchrotron Rad. (2002). 9, 293-297 [ doi:10.1107/S0909049502010117 ] Time dependence of the polarization of short X-ray pulses after crystal reflectionW. GraeffSynopsis: The time dependence of the polarization of short X-ray pulses is simulated by Fourier transforms using the steady-state solutions from dynamical theory. The mixed states in particular show a very pronounced time dependence, as perpendicular and parallel polarization components have a different time response. Online 31 August 2002 |
J. Synchrotron Rad. (2002). 9, 298-303 [ doi:10.1107/S0909049502010567 ] Interaction of atomic systems with X-ray free-electron lasersM. A. Kornberg, A. L. Godunov, S. Itza-Ortiz, D. L. Ederer, J. H. McGuire and L. YoungSynopsis: Atomic applications for XFELs are presented that include strong field effects, multiple ionization and hollow-atom formation. Online 31 August 2002 |
J. Synchrotron Rad. (2002). 9, 304-308 [ doi:10.1107/S0909049502012955 ] First steps towards time-resolved BioXAS at room temperature: state transitions of the manganese complex of oxygenic photosynthesisM. Haumann, P. Pospísil, M. Grabolle, C. Müller, P. Liebisch, V. A. Solé, T. Neisius, J. Dittmer, L. Iuzzolino and H. DauSynopsis: First time-resolved X-ray absorption spectroscopy experiments to study oxidation state and structural changes of biological metal centers are reported. The future impact of time-resolved BioXAS is discussed. Online 31 August 2002 |
J. Synchrotron Rad. (2002). 9, 309-312 [ doi:10.1107/S0909049502011949 ] X-ray diffractometer designed for industrial applications at SPring-8 BL24XUE. Yanase, K. V. Zolotarev, K. Nishio, Y. Kusumi, H. Okado and K. AraiSynopsis: An X-ray diffractometer has been designed for industrial applications and installed at SPring-8 BL24XU in Japan. The diffractometer has been used for the grazing-incidence X-ray diffraction measurement of ion-implanted chromium-coated samples and for the X-ray stress measurement of polished stainless steel using our proposed new method. Online 31 August 2002 |
J. Synchrotron Rad. (2002). 9, 313-316 [ doi:10.1107/S0909049502012578 ] Nearly diffraction-limited line focusing of a hard-X-ray beam with an elliptically figured mirrorK. Yamauchi, K. Yamamura, H. Mimura, Y. Sano, A. Saito, A. Souvorov, M. Yabashi, K. Tamasaku, T. Ishikawa and Y. MoriSynopsis: X-ray focusing with an elliptically figured mirror is investigated. Online 31 August 2002 |
J. Synchrotron Rad. (2002). 9, 317-322 [ doi:10.1107/S0909049502009986 ] Cryogenically cooled bent double-Laue monochromator for high-energy undulator X-rays (50-200 keV)S. D. Shastri, K. Fezzaa, A. Mashayekhi, W.-K. Lee, P. B. Fernandez and P. L. LeeSynopsis: A cryogenically cooled silicon monochromator for high-energy undulator X-rays (50-200 keV) using two bent Laue crystals is presented. Online 31 August 2002 |
J. Synchrotron Rad. (2002). 9, 323-324 [ doi:10.1107/S0909049502011597 ] New pressure flow cell to monitor BaSO4 precipitation using synchrotron in situ angle-dispersive X-ray diffractionA. Hennessy, G. Graham, J. Hastings, D. P. Siddons and Z. ZhongSynopsis: A description of the commissioning of a new high-pressure flow cell, used to monitor in situ precipitation of barium sulphate under non-ambient conditions. Online 31 August 2002 |
J. Synchrotron Rad. (2002). 9, 325 forthcoming meetings and short courses |
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