issue contents

Journal logoJOURNAL OF
ISSN: 1600-5775

March 2003 issue

Highlighted illustration

Cover illustration: Scanning electron micrographs of diamond refractive lenses etched 40 µm deep into a bulk CVD diamond substrate, see Nöhammer, Hoszowska, Freund & David, pages 168-171.

facility information

research papers

J. Synchrotron Rad. (2003). 10, 113-119
doi: 10.1107/S0909049502022549
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Magnetic X-ray absorption fine-structure spectra have been measured and analyzed for Ni–Mn alloys.

J. Synchrotron Rad. (2003). 10, 120-124
doi: 10.1107/S0909049502021155
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Time-dependent perturbation theory and a model form of the core-hole–photoelectron potential are used to obtain results for the secondary electron shake-off probabilities as a function of photon energy above the X-ray absorption edge. The shake-off probabilities and the resulting EXAFS amplitude reduction factor agree reasonably well with experiment close to an absorption edge and in the region of energy appropriate to EXAFS data analysis. The model form for the potential gives excitation probabilities which are too large at high photon energies.

J. Synchrotron Rad. (2003). 10, 125-136
doi: 10.1107/S0909049502017739
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Two scanning transmission X-ray microscopes featuring laser interferometry have been commissioned at the ALS. Improved stability and imaging properties, as well as efficient use of the instruments, has been achieved.

J. Synchrotron Rad. (2003). 10, 137-143
doi: 10.1107/S0909049502021362
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The technique of white-beam scanning X-ray microdiffraction when applied to samples consisting of multiple micrograins is described in detail. The application of the technique to two samples of thin-film metals is presented.

J. Synchrotron Rad. (2003). 10, 144-147
doi: 10.1107/S0909049502022343
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An approach to X-ray attenuation correction for diffraction anomalous fine-structure (DAFS) measurements is presented, taking into account energy-dependent secondary extinction effects.

J. Synchrotron Rad. (2003). 10, 148-153
doi: 10.1107/S0909049502019076
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High-resolution synchrotron radiation diffraction allowed solid-state kinetics and strain relaxation, as a function of time and temperature, in the nickel-base superalloy SC16. Precipitates are born coherent but lose coherencey afer a few hours, and decay times are comparable with the timescale of the increase of the γ′ volume fraction.

J. Synchrotron Rad. (2003). 10, 154-167
doi: 10.1107/S0909049502020289
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A novel time-resolved diffraction technique has been used to investigate phase-transformation dynamics and microstructural evolution in both the heat-affected zone and fusion zone in carbon–manganese steel arc welds during the welding process down to a time resolution of 50 ms.

J. Synchrotron Rad. (2003). 10, 168-171
doi: 10.1107/S0909049502019532
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Planar refractive hard X-ray lenses etched into bulk diamond have been developed. The lenses should be able to withstand the extreme flux densities expected at the planned fourth-generation X-ray sources.

J. Synchrotron Rad. (2003). 10, 172-176
doi: 10.1107/S0909049502018654
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The predicted performance of two phase plates on the XMaS beamline are confirmed by polarization analysis, dichroism measurements and reflectivity studies on UAs/Co multilayers.

J. Synchrotron Rad. (2003). 10, 177-182
doi: 10.1107/S0909049502019167
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CO oxidation with a Pt/ceria–zirconia catalyst has been studied by in situ X-ray diffraction at the beamline GILDA of ESRF. The time-resolved X-ray diffraction pattern of the catalyst was recorded by the translating imaging plate implemented at GILDA, while the CO2 yield was monitored by a mass quadrupole spectrometer.

J. Synchrotron Rad. (2003). 10, 183-186
doi: 10.1107/S0909049502022495
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An automatic procedure is described for calibrating the wavelength and the detector arm offset angle of angular-dispersive powder diffractometers at synchrotron sources.

J. Synchrotron Rad. (2003). 10, 187-190
doi: 10.1107/S0909049502019854
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A windowless small ionization chamber detector was developed at the European Synchrotron Radiation Facility for monitoring the intensity of the focused beam during X-ray microprobe measurements. In the present work the technical characteristics, such as the current–voltage curve, stability and linearity, of the small monitor were tested.

short communications

J. Synchrotron Rad. (2003). 10, 191-192
doi: 10.1107/S090904950202352X
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Some points concerning the characteristics of the X-ray simulation code SHADOW are clarified which are not correctly mentioned by Yamada et al. [J. Synchrotron Rad. (2001), 8, 1047–1050].

computer programs

J. Synchrotron Rad. (2003). 10, 193-196
doi: 10.1107/S0909049502019659
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An interactive analytical and data-monitoring program for small-angle X-ray solution scattering measurements that processes the data without disciplined knowledge of small-angle scattering is described.

addenda and errata

J. Synchrotron Rad. (2003). 10, 197
doi: 10.1107/S0909049503002656

letters to the editor

J. Synchrotron Rad. (2003). 10, 198
doi: 10.1107/S0909049502017508

J. Synchrotron Rad. (2003). 10, 199
doi: 10.1107/S0909049503002097

J. Synchrotron Rad. (2003). 10, 200-201
doi: 10.1107/S0909049503002103

current events

J. Synchrotron Rad. (2003). 10, 202
doi: 10.1107/S0909049503003091

J. Synchrotron Rad. (2003). 10, 202
doi: 10.1107/S0909049503003108

J. Synchrotron Rad. (2003). 10, 202
doi: 10.1107/S090904950300311X

J. Synchrotron Rad. (2003). 10, 202
doi: 10.1107/S0909049503003121
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