Figure 1 Schematic of the measured sample Cu (5  nm)/Ni (5  nm)/Cu (70  nm)/Co (1.8  nm)/NiO (1  nm)/GaAs(110). The thickness of the layers is given according to the characterization by Li et al. (2002). Polycrystalline and single-crystalline regions of the sample are indicated by PC and SC, respectively. Also shown are the experimental scattering geometries for (A) X-rays perpendicular to the wires and (B) X-rays parallel to the wires.

© International Union of Crystallography 2004