Image quality improvement in a hard X-ray projection microscope using total reflection mirror optics

Mimura, H.; Yamauchi, K.; Yamamura, K.; Kubota, A.; Matsuyama, S.; Sano, Y.; Ueno, K.; Endo, K.; Nishino, Y.; Tamasaku, K.; Yabashi, M.; Ishikawa, T.; Mori, Y.

doi:10.1107/S090904950401283X

Figure 4
Figure error profiles characterized in (a) short, (b) middle and (c) long spatial wavelength ranges to be used in the investigation of the relation between the nature of figure errors and the uniformity of diverging X-ray beams.